Date of this Version
Pub. No.: US 2012/0314214 A1
A material can be analyzed using short pulses by applying a first pulse and a second pulse to the material in which the second pulse is delayed relative to the first pulse. The first and second pulses are directed toward a material along collinear paths, and the material is ablated using the first pulse to cause particles to be emitted from the surface of the material. The emitted particles are atomized and/or ionized using the second pulse, and the radiation from the atomized and/or ionized particles is analyzed.