SAMPLE INVESTIGATING SYSTEM AND METHOD OF USE

Authors

Martin M. Liphardt, Lincoln, Ne
Thomas E. Tiwald, Lincoln, Ne
Blaine D. Johs, Lincoln, Ne
Jeffery S. Hale, Lincoln, Ne
Craig M. Herzinger, Lincoln, Ne
Steven E. Green, Lincoln, Ne
Ping He, Lincoln, Ne
Ronald A. Synowicki, Lincoln, Ne
John A. Woollam, Lincoln, NeFollow

Date of this Version

4-17-2012

Citation

United States Patent Patent No.: Us 8,159,672 B1

Abstract

A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.