Electrical & Computer Engineering, Department of
Document Type
Article
Date of this Version
2009
Citation
United States Patent Liphardt et al. Patent No.: US 7,477,388 B1
Abstract
A system and method of preventing substrate backside reflected components in a beam of electromagnetic radiation caused to reflect from the surface of a sample in an ellipsometer or polarimeter system, involving placing a mask adjacent to the surface of the sample which allows electromagnetic radiation to access the sample over only a limited area, wherein to access the sample over only a limited area, wherein the mask can include detector elements for collecting electromagnetic radiation reflected from the sample backside.
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