SAMPLE INVESTIGATING SYSTEM

Authors

Martin M. Liphardt, Lincoln, Ne
Thomas E. Tiwald, Lincoln, Ne
Blaine D. Johs, Lincoln, Ne
Jeffery S. Hale, Lincoln, Ne
Craig M. Herzinger, Lincoln, Ne
Steven E. Green, Lincoln, Ne
Ping He, Lincoln, Ne
Ronald A. Synowicki, Lincoln, Ne
John A. Woollam, Lincoln, NeFollow

Date of this Version

2009

Citation

United States Patent Liphardt et al. Patent No.: US 7,623,237 B1

Abstract

A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which refelcts from said sample back onto said sample and then into the detector along a locus which is in a plance of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detecor, including means for reducing reflections of a beam fo electromagnetic from the back of a sample, including methodology of use.