Electrical & Computer Engineering, Department of

 

Document Type

Article

Date of this Version

4-17-2012

Citation

Patent No.: US 8,159,672 B1

Abstract

A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.

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