Excess charge-carrier induced instability of hybrid perovskites

Authors

Yuze Lin, University of North Carolina
Bo Chen, University of Nebraska-Lincoln
Yanjun Fang, University of Nebraska-Lincoln
Jingjing Zhao, University of Nebraska-LincolnFollow
Chunxiong Bao, University of Nebraska-Lincoln
Zhenhua Yu, University of North Carolina
Yehao Deng, University of North Carolina
Peter N. Rudd, University of North Carolina
Yanfa Yan, University of Toledo
Yongbo Yuan, Central South University
Jinsong Huang, University of North CarolinaFollow

ORCID IDs

0000-0002-7223-2324

0000-0001-7076-7635

0000-0003-3977-5789

0000-0002-0509-8778

Document Type

Article

Date of this Version

2018

Citation

NATURE COMMUNICATIONS | (2018) 9:4981

Comments

© The Author(s) 2018

Open access

DOI: 10.1038/s41467-018-07438-w

Abstract

Identifying the origin of intrinsic instability for organic–inorganic halide perovskites (OIHPs) is crucial for their application in electronic devices, including solar cells, photodetectors, radiation detectors, and light-emitting diodes, as their efficiencies or sensitivities have already been demonstrated to be competitive with commercial available devices. Here we show that free charges in OIHPs, whether generated by incident light or by current-injection from electrodes, can reduce their stability, while efficient charge extraction effectively stabilizes the perovskite materials. The excess of both holes and electrons reduce the activation energy for ion migration within OIHPs, accelerating the degradation of OIHPs, while the excess holes and electrons facilitate the migration of cations or anions, respectively. OIHP solar cells capable of efficient charge-carrier extraction show improved light stability under regular operation conditions compared to an open-circuit condition where the photo-generated charges are confined in the perovskite layers.