Complementary Microscopy Techniques Applied for Characterizing the Localized Nanoscale Structure of Poly (Vinylidene Fluoride)

Authors

Wen Qian, University of Nebraska-LincolnFollow
Shuo Sun, University of Nebraska-LincolnFollow
Charles Nguyen, University of Nebraska-Lincoln
Wenlong Li, University of Nebraska - LincolnFollow
Stephen Ducharme, University of Nebraska - LincolnFollow
Joesph A. Turner, University of Nebraska-LincolnFollow

Date of this Version

2018

Citation

Published in Microscopy and Microanalysis 24 (S1), 2018, pp. 2040-2041.

doi:10.1017/S1431927618010681

Comments

Copyright © 2018 Microscopy Society of America. Published by Cambridge University Press. Used by permission.

Abstract

Poly (vinylidenefluoride) (PVDF), a well-recognized electroactive polymer, has been studied extensively over many decades. Recently, there has been increasing interest in tuning the electrical properties of PVDF from ferroelectric to piezoelectric and to pyroelectric, which can be attained via controlling the microscale structure down to the nanoscale structure [1-2]. To optimize the preparation conditions of PVDF and its copolymers, as well as to improve the performance for many applications, comprehensive analytical techniques are of great importance. In this paper, we demonstrate complementary nanoscale characterization and measurement techniques, by conducting a systematic and coordinated study involving scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), atomic force microscopy (AFM), nanoscale infrared (IR) spectroscopy, chemical mapping and force mapping, to probe the localized morphology, crystalline structure, molecular structure, chemical property and stiffness mapping at the nanoscale.