Mechanical & Materials Engineering, Department of
Complementary Microscopy Techniques Applied for Characterizing the Localized Nanoscale Structure of Poly (Vinylidene Fluoride)
Date of this Version
Published in Microscopy and Microanalysis 24 (S1), 2018, pp. 2040-2041.
Poly (vinylidenefluoride) (PVDF), a well-recognized electroactive polymer, has been studied extensively over many decades. Recently, there has been increasing interest in tuning the electrical properties of PVDF from ferroelectric to piezoelectric and to pyroelectric, which can be attained via controlling the microscale structure down to the nanoscale structure [1-2]. To optimize the preparation conditions of PVDF and its copolymers, as well as to improve the performance for many applications, comprehensive analytical techniques are of great importance. In this paper, we demonstrate complementary nanoscale characterization and measurement techniques, by conducting a systematic and coordinated study involving scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), atomic force microscopy (AFM), nanoscale infrared (IR) spectroscopy, chemical mapping and force mapping, to probe the localized morphology, crystalline structure, molecular structure, chemical property and stiffness mapping at the nanoscale.
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