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Peter Dowben Publications

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Document Type

Article

Date of this Version

May 1998

Comments

Published in Mat. Res. Soc. Symp. Proc. Vol. 528. © l998 Materials Research Society. Permission to use.

Abstract

The growth of strained thin films of gadolinium has been investigated with low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM) and compared to the film growth of unstrained gadolinium. Strained thin films of gadolinium are distinct from the unstrained films by a substrate induced preferential domain growth direction, which is also reflected in the electronic structure.

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