Identification of the Possible Defect States in Poly(3-hexylthiophene) Thin Films

Authors

D.-Q. Feng, University of Nebraska-Lincoln
A. N. Caruso, North Dakota State UniversityFollow
Yaroslav B. Losovyj, Louisiana State University at Baton RougeFollow
D. L. Schulz, North Dakota State University
Peter A. Dowben, University of Nebraska-LincolnFollow

Date of this Version

12-10-2007

Comments

Published in Polymer Engineering and Science 47 (2007), pp. 1359–1364; doi 10.1002/pen.20820 Copyright © 2007 Society of Plastics Engineers; published by John Wiley & Sons, Inc. Used by permission. Published online in Wiley InterScience http://www.interscience.wiley.com

Abstract

The possible origins of a low density of defect states within the highest occupied molecular orbital to lowest unoccupied molecular orbital gap are suggested for regioregular poly(3- hexylthiophene). A number of chemical defects, impurities, and structural defects could contribute to features in photoemission for regioregular poly(3-hexylthiophene), observed within the highest occupied molecular orbital to lowest unoccupied molecular orbital gap of regioregular poly(3-hexylthiophene).