Department of Physics and Astronomy: Individual Faculty Pages

 

Peter Dowben Publications

Accessibility Remediation

If you are unable to use this item in its current form due to accessibility barriers, you may request remediation through our remediation request form.

Document Type

Article

Date of this Version

2012

Citation

PHYSICAL REVIEW B 85, 014406 (2012); DOI: 10.1103/PhysRevB.85.014406

Comments

Copyright 2012 American Physical Society

Abstract

High quality films of EuO and Eu0.96Gd0.04O were grown on p-type Si(100) via pulsed laser deposition. X-raydiffraction results show that the addition of Gd changes the growth texture from [001] to [111]. Angular-resolved photoemission spectroscopy reveals electron pockets around the X points in Gd-doped EuO, indicating that the band gap in EuO is indirect. Combined photoemission and inverse photoemission measurements showan apparent transition from n-type to p-type behavior, which is likely due to band bending near the polar (111) surface.

Included in

Physics Commons

Share

COinS