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Peter Dowben Publications
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Document Type
Article
Date of this Version
2013
Citation
Mater. Res. Soc. Symp. Proc. Vol. 15 © 2013
Abstract
The electronic properties of ThO2 single crystals were studied using x-ray photoemission spectroscopy (XPS). The XPS results show that the Th 4f core level is in an oxidation state that is consistent with that expected for Th in ThO2. The effective Debye temperature is estimated from the temperature dependent photoemission intensities of the Th 4f core level over the temperature range of 290 to 360 K. A Debye temperature of 468±32 K has been determined.
Comments
U.S. Government work