Characterization of domain distributions by second harmonic generation in ferroelectrics

Authors

Yuan Zhang, Xiangtan University
Yi Zhang, Xiangtan University
Quan Guo, National University of Defense Technology
Xiangli Zhong, Xiangtan UniversityFollow
Yinghao Chu, National Chiao Tung University
Haidong Lu, University of Nebraska-LincolnFollow
Gaokuo Zhong, Xiangtan University
Jie Jiang, Xiangtan University
Congbing Tan, Xiangtan University
Min Liao, Xiangtan University
Zhihui Lu, National University of Defense Technology
Dongwen Zhang, National University of Defense Technology
Jinbin Wang, Xiangtan University
Jianmin Yuan, National University of Defense TechnologyFollow
Yichun Zhou, Xiangtan UniversityFollow

ORCID IDs

Yi Zhang

Yinghao Chu

Gaokuo Zhong

Date of this Version

2019

Citation

npj Computational Materials (2018) 4:39

Comments

Open access

doi:10.1038/s41524-018-0095-6

Abstract

Domain orientations and their volume ratios in ferroelectrics are recognized as a compelling topic recently for domain switching dynamics and domain stability in devices application. Here, an optimized second harmonic generation method has been explored for ferroelectric domain characterization. Combing a unique theoretical model with azimuth-polarization-dependent second harmonic generation response, the complex domain components and their distributions can be rigidly determined in ferroelectric thin films. Using the proposed model, the domain structures of rhombohedral BiFeO₃ films with 71° and 109° domain wall, and, tetragonal BiFeO₃, Pb(Zr_0.2Ti_0.8)O₃, and BaTiO₃ ferroelectric thin films are analyzed and the corresponding polarization variants are determined. This work could provide a powerful and all-optical method to track and evaluate the evolution of ferroelectric domains in the ferroelectric-based devices.