Piezoresponse force microscopy and recent

Authors

• Alexei Gruverman, University of Nebraska-LincolnFollow
• Sergei V. Kalinin, Oak Ridge National LaboratoryFollow

Document Type

Article

Date of this Version

1-1-2006

Comments

Published in JOURNAL OF MATERIALS SCIENCE 41 (2006) 107–116. DOI: 10.1007/s10853-005-5946-0. Copyright 2006. Used by permission.

Abstract

In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nanoscale ferroelectric research, summarize the basic principles of PFM, illustrate what information can be obtained from PFM experiments and delineate the limitations of PFM signal interpretation relevant to quantitative imaging of a broad range of piezoelectrically active materials. Particular attention is given to orientational PFM imaging and data interpretation as well as to electromechanics and kinetics of nanoscale ferroelectric switching in PFM.