Experimental evidence of strain relaxed domain structure in (100)/(001)-oriented epitaxial lead titanate thick films grown by metal organic chemical vapor deposition

Authors

• Hiroshi Nakaki, Tokyo Institute of Technology, Yokohama, Japan
• Yong Kwan Kim, Tokyo Institute of Technology, Yokohama, Japan
• Shintaro Yokoyama, Tokyo Institute of Technology, Yokohama, Japan
• Rikyu Ikariyama, Tokyo Institute of Technology, Yokohama, Japan
• Hiroshi Funakubo, Tokyo Institute of Technology, Yokohama, Japan
• S. K. Streiffer, Argonne National Laboratory, Argonne, Illinois
• Ken Nishida, National Defense Academy, Japan
• Keisuke Saito, Application Laboratory, Bruker AXS, 3-9-A Moriya-cho, Kanagawa-ku, Yokohama 221-0022, Japan
• Alexei Gruverman, University of Nebraska-LincolnFollow

Document Type

Article

Date of this Version

January 2008

Comments

Published in JOURNAL OF APPLIED PHYSICS 104, 064121 (2008). Copyright © 2008 American Institute of Physics. Used by permission.

Abstract

Epitaxial (100)/(001)-oriented PbTiO₃ films with thickness of 2.8 μm were grown on Nb-doped (100) SrTiO₃ substrates by pulsed metal organic chemical vapor deposition. Complex domain structures consisting of c-domains (c1) and three types of a-domains (a1, a2, and a3) were observed by piezoresponse force microscopy in conjunction with high-resolution x-ray diffraction analysis. The obtained results suggest that (a2/a3) and (a1/c1) domain configurations represent mostly strain-relaxed structures. This conclusion is in good agreement with theoretical predictions made for thick films [Phys. State., Solidi 37, 329 (1976)].