Complex domain structure in relaxed PbTiO3 thick films grown on (100)cSrRuO3//(100)SrTiO3 substrates

Authors

Shintaro Yasui, Tokyo Institute of TechnologyFollow
Yoshitaka Ehara, Tokyo Institute of Technology
Satoru Utsugi, Tokyo Institute of TechnologyFollow
Mitsumasa Nakajima, Tokyo Institute of Technology
Hiroshi Funakubo, Tokyo Institute of TechnologyFollow
Alexei Gruverman, University of Nebraska-LincolnFollow

Date of this Version

2012

Citation

JOURNAL OF APPLIED PHYSICS 112, 052001 (2012); http://dx.doi.org/10.1063/1.4746078

Comments

Copyright 2012 American Institute of Physics. Used by permission.

Abstract

Domain structures of epitaxial PbTiO₃ films grown on (100)_cSrRuO₃//(100)SrTiO₃ substrates by metalorganic chemical vapor deposition were investigated by x-ray diffraction (XRD) and piezoresponse force microscopy (PFM) techniques. It was found that with increasing film thickness, the domain structure changed from simple (001) polarization orientation to a complicated mixture of (001) and (100) orientations. PFM mappings showed that in the thicker films (~1100 nm), the zigzag (001)/(100) domain boundaries made an angle of approximately 87° instead of 90° typically observed in (001)/(100) domain patterns in thinner (<300 nm) films. Full-relaxed tilting angle θ₁+ θ₂+θ₃=3.4° obtained from cross-sectional profile analysis of topological step-terrace structure was in good agreement with 3.4° and 3.6° angle values obtained from XRD measurements and theoretical prediction, respectively.