The Effects of Architecture and Process on the Hardness of Programmable Technologies

Robert Katz, University of Nebraska - Lincoln
J.J. Wang, Actel Corporation, Sunnyvale, CA
R. Reed, NASA Goddard Space Flight Center, Greenbelt, MD
I. Kleyner, Orbital Sciences Corporation, Greenbelt, MD
M. D'Ordine, Ball Aerospace and Technologies Corp., Boulder, CO
J. McCollum, Actel Corporation, Sunnyvale, CA
B. Cronquist, Actel Corporation, Sunnyvale, CA
J. Howard, Jackson and Tull, Chartered Engineers, Seabrook, MD

Document Type Article

Published in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 46, NO. 6, DECEMBER 1999.

Abstract

Architecture and process, combined, significantly affect the hardness of programmable technologies. The effects of high energy ions, ferroelectric memory architectures, and shallow trench isolation are investigated. A detailed single event latchup (SEL) study has been performed.