The Effects of Architecture and Process on the Hardness of Programmable Technologies
Document Type Article
Published in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 46, NO. 6, DECEMBER 1999.
Architecture and process, combined, significantly affect the hardness of programmable technologies. The effects of high energy ions, ferroelectric memory architectures, and shallow trench isolation are investigated. A detailed single event latchup (SEL) study has been performed.