Department of Physics and Astronomy: Publications and Other Research
Document Type
Article
Date of this Version
April 2006
Abstract
We report on nonepitaxially grown L10 Cu-alloyed FePt thin films with strong (001) texture. The FePt films with different Cu contents were deposited directly on Si wafers with a Fe49Pt51/Cu multilayer structure. The Cu content was varied from 0 to 13 at. %. All films were annealed at 600 °C for 5 min. X-ray-diffraction characterization showed that only one set of L10 diffraction peaks appeared and no elemental Cu diffraction peaks were visible. This result, along with a varying c/a lattice-parameter ratio, suggests that Cu substitutes Fe or Pt in the L10 lattice and ternary FePtCu alloy films are formed. (001) texture was enhanced with the increase of Cu content. Transmission electron microscope images showed that the grain size of FePtCu was about 10 nm. For FePt film with 11 at. % Cu substitution, coercivity was about 5 kOe, which is suitable for writing in a practical perpendicular-recording film.
Comments
Published by American Institute of Physics. J. Applied Physics 99, 08G903 (2006). ©2006 American Institute of Physics. Permission to use. http://jap.aip.org/jap/.