Magnetic force microscopy observations of the magnetic behavior in Co–C nanodot arrays

Authors

• L. Gao, University of Nebraska - Lincoln
• Sy_Hwang Liou, University of Nebraska-LincolnFollow
• M. Zheng, University of Nebraska - Lincoln
• Ralph Skomski, University of Nebraska-LincolnFollow
• M.L. Yan, University of Nebraska - Lincoln
• David J. Sellmyer, University of Nebraska-LincolnFollow
• N.I. Polushkin, Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhni Novgorod, Russia

Document Type

Article

Date of this Version

May 2002

Comments

Published by American Institute of Physics. J. Appl. Phys. 91, 7311 (2002). ©2002 American Institute of Physics. Permission to use. http://jap.aip.org/jap/.

Abstract

The nanomagnetic behavior of Co–C nanodot arrays was investigated by magnetic force microscopy (MFM) and an alternative gradient force magnetometer. The direction of the easy axis can be observed directly with MFM by comparing the saturated magnetization state and the remanent magnetization state. Interaction of the domain wall with local defects was observed by field dependent MFM measurements. Some types of defects that can pin domain wall movement were identified.