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Document Type
Article
Date of this Version
2014
Citation
JHEP 0.3 (2014) 132 doi:10.1007/JHEP03(2014)132
Abstract
The uncertainties on the mistagged NTMJ background include the statistical uncertainty on the sample after loose selection, to which the mistag probability is applied; the statistical uncertainty on the mistag probability itself, ranging from 2to ≈10% at 3TeV/c2; and the systematic uncertainty on the mistag probability application, as described in section 3.3, which is in the range of 1 to 5% depending on the tt mass. The total background uncertainty is ≈5% for the low-mass region, dominated by the systematic uncertainty, and ≈100% for the high-mass region, dominated by statistical uncertainty associated with the sample after loose selection.
Comments
Published by SCOAP3 under Creative Commons License.