Determination of the optical dispersion in ferroelectric vinylidene fluoride (70%)/trifluoroethylene (30%) copolymer Langmuir-Blodgett films

Authors

Mengjun Bai, University of Nebraska-LincolnFollow
A.V. Sorokin, University of Nebraska - Lincoln
Daniel W. Thompson, University of Nebraska-LincolnFollow
Matt Poulsen, University of Nebraska-LincolnFollow
Stephen Ducharme, University of NebraskaFollow
C.M. Herzinger, J. A. Woollam Company, Lincoln, Nebraska
S. Palto, Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
V.M. Fridkin, Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
S.G. Yudin, Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
V.E. Savchenko, State Institute for Machinery Research and Development (NIEKMI), Ivanovo, Russia
L.K. Gribova, State Institute for Machinery Research and Development (NIEKMI), Ivanovo, Russia

Date of this Version

4-1-2004

Comments

Published by American Institute of Physics. J. Applied Physics 95, 3372-76 (2004). ©2004 American Institute of Physics. Permission to use. Journal home page = http://jap.aip.org/jap/.

Abstract

We report measurements of the optical dispersion in ferroelectric Langmuir–Blodgett films of polyvinylidene fluoride (70%)-trifluoroethylene (30%) copolymer, using variable-angle spectroscopic ellipsometry over a wide spectral range from infrared to ultraviolet. Film thickness averaged 1.78±0.07 nm per deposition layer for films ranging from 5 to 125 deposition layers as determined from multi-sample analysis. This deposition rate was consistent with capacitance measurements, yielding a dielectric constant of 9.9±0.4 normal to the film, by quartz microbalance measurements, and by atomic force microscopy.