Determination of the optical dispersion in ferroelectric vinylidene fluoride (70%)/trifluoroethylene (30%) copolymer Langmuir-Blodgett films

Authors

• Mengjun Bai, University of Nebraska-LincolnFollow
• A.V. Sorokin, University of Nebraska - Lincoln
• Daniel W. Thompson, University of Nebraska-LincolnFollow
• Matt Poulsen, University of Nebraska-LincolnFollow
• Stephen Ducharme, University of NebraskaFollow
• C.M. Herzinger, J. A. Woollam Company, Lincoln, Nebraska
• S. Palto, Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
• V.M. Fridkin, Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
• S.G. Yudin, Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
• V.E. Savchenko, State Institute for Machinery Research and Development (NIEKMI), Ivanovo, Russia
• L.K. Gribova, State Institute for Machinery Research and Development (NIEKMI), Ivanovo, Russia

Document Type

Article

Date of this Version

4-1-2004

Comments

Published by American Institute of Physics. J. Applied Physics 95, 3372-76 (2004). ©2004 American Institute of Physics. Permission to use. Journal home page = http://jap.aip.org/jap/.

Abstract

We report measurements of the optical dispersion in ferroelectric Langmuir–Blodgett films of polyvinylidene fluoride (70%)-trifluoroethylene (30%) copolymer, using variable-angle spectroscopic ellipsometry over a wide spectral range from infrared to ultraviolet. Film thickness averaged 1.78±0.07 nm per deposition layer for films ranging from 5 to 125 deposition layers as determined from multi-sample analysis. This deposition rate was consistent with capacitance measurements, yielding a dielectric constant of 9.9±0.4 normal to the film, by quartz microbalance measurements, and by atomic force microscopy.