Research Papers in Physics and Astronomy

 

Date of this Version

4-1-2004

Comments

Published by American Institute of Physics. J. Applied Physics 95, 3372-76 (2004). ©2004 American Institute of Physics. Permission to use. Journal home page = http://jap.aip.org/jap/.

Abstract

We report measurements of the optical dispersion in ferroelectric Langmuir–Blodgett films of polyvinylidene fluoride (70%)-trifluoroethylene (30%) copolymer, using variable-angle spectroscopic ellipsometry over a wide spectral range from infrared to ultraviolet. Film thickness averaged 1.78±0.07 nm per deposition layer for films ranging from 5 to 125 deposition layers as determined from multi-sample analysis. This deposition rate was consistent with capacitance measurements, yielding a dielectric constant of 9.9±0.4 normal to the film, by quartz microbalance measurements, and by atomic force microscopy.

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