Electrical & Computer Engineering, Department of


Date of this Version



Patent No . : US 10 , 048 , 059 B1


Disclosed are systems and methods that enable determination of uncorrelated thickness of a working electrode and surface region optical constants in settings involving electrochemical processing at a working electrodes in a Piezo electric Balance system , by simultaneous application of an Ellipsometer system , the working electrode optionally having a multiplicity of nanofibers that are oriented non normally to a surface of said working electrode . Further disclosed is , simultaneous with said determinations , the monitoring of electrochemical processes at a piezoelectric balance working electrode driven by electrical energy applied between said working electrode and counter electrode .