Electrical & Computer Engineering, Department of
Date of this Version
10-16-2018
Citation
Patent No . : US 10 , 101 , 265 B1
Abstract
Ellipsometers and polarimeters or the like to investigate analyte containing fluids applied to a substrate - stage having a multiplicity of nano - structures that project non - normal to a surface thereof , including dynamics of interaction there with , to the end of evaluating and presenting at least partial Jones or Mueller Matricies corresponding to a multiplicity of locations over an imaged area .
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