Superlattice modulation and epitaxy of Tl₂Ba₂Ca₂Cu₃O₁₀ thin films grown on MgO and SrTiO₃ substrates

Authors

C.H. Chen, AT&T Bell Laboratories, Murray Hill, New Jersey
M. Hong, AT&T Bell Laboratories, Murray Hill, New Jersey
D.J. Werder, AT&T Bell Laboratories, Murray Hill, New Jersey
J. Kwo, AT&T Bell Laboratories, Murray Hill, New Jersey
Sy_Hwang Liou, University of Nebraska-LincolnFollow
D.D. Bacon, AT&T Bell Laboratories, Murray Hill, New Jersey

Date of this Version

April 1989

Comments

Published by American Institute of Physics. Appl. Phys. Lett. 54, 1579 (1989). © 1989 American Institute of Physics. Permission to use. http://jap.aip.org/jap/.

Abstract

We compare the superlattice modulation, microstructure, and epitaxy of Tl₂Ba₂Ca₂Cu₃O₁₀ thin films grown on MgO [100] and SrTiO₃ [100] substrates by dc diode sputtering. Films grown on MgO were found to be quite clean with the c axis perpendicular to the substrate. However, no in-plane orientational relationship to the substrate was found. Films grown on SrTiO₃, on the other hand, showed very good epitaxy to the substrate despite the presence of second phases. Films grown on MgO also exhibited a longer coherence length of the superlattice modulation than those grown on SrTiO₃ under identical conditions.