SIMPLE SEQUENCE REPEAT DNA MARKERS LINKED WITH GENES FOR RESISTANCE TO MAJOR DISEASES OF COMMON BEAN

Authors

G. Valentini, Universidade Estadual de Maringá
M. C. Gonçalves-Vidigal, Universidade Estadual de Maringá
P. B. Cregan, USDA-ARS
Q. Song, USDA-ARSFollow
M. A. Pastor-Corrales, USDA-ARSFollow

Document Type

Article

Date of this Version

3-2017

Citation

Published in ANNUAL REPORT OF THE BEAN IMPROVEMENT COOPERATIVE, Vol. 60, March 2017.

Abstract

INTRODUCTION: Rust, anthracnose (ANT), and angular leaf spot (ALS) are widespread and devastating diseases of the common bean in Latin America and Africa. Using cultivars with disease resistance is the most cost-effective strategy to manage these diseases. Single and dominant genes condition the resistance to rust, ANT, and ALS in common bean. Combining different genes into single cultivars to manage one or more of these diseases is one of the main objectives of many common bean breeding programs. Bean cultivars with broad resistance to some of these diseases have been developed by combining several resistance genes using traditional, laborious, and time-consuming methods to pyramid these genes. To accelerate and facilitate gene pyramiding, effective, inexpensive, and easy to use DNA markers are needed. Simple sequence repeat (SSR) DNA markers are effective, co-dominant, and easy to visualize in most laboratories in developing or developed nations. The objective of this study was to discover SRR markers closely linked to genes for resistance to the rust, ANT, and ALS diseases.