U.S. Department of Agriculture: Agricultural Research Service, Lincoln, Nebraska

 

Date of this Version

3-2017

Citation

ANNUAL REPORT OF THE BEAN IMPROVEMENT COOPERATIVE, No. 60, March 2017. Published by USDA.

Comments

U.S. government work.

Abstract

INTRODUCTION. White mold (WM), caused by the fungus Sclerotinia sclerotiorum, is a serious constraint of common bean during the fall-winter season in Brazil. The most commonly used control measure is fungicide application. However, the high cost and the potentially deleterious effects on human health and environment have motivated the search for new options of WM management. Genetic resistance is a key component of the WM management, because it is easier for farmers to adopt and is environmentally safe. Since 2008, we have screened common bean lines/cultivars for WM resistance from the field trials named Value for Cultivation and Use (VCU) conducted under WM pressure. The lines screened in these trials have been developed by Federal University of Viçosa, Federal University of Lavras, EPAMIG and Embrapa Rice and Beans. Beginning in 2015, we have evaluated the genotypes screened in the VCU trials in comparison to three WM-resistant checks (A195, G122, and Cornell 605) in advanced field trials, straw and/or detached leaflet tests. Here, we present results from the straw and the detached leaflet tests to assess physiological resistance of lines/cultivars originally screened for resistance to foliar diseases and high yield.

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