2009

Thin Films Formed by Selenization of CuInxB1−x Precursors in Se Vapor, C. A. Kamler, Rodney J. Soukup, Natale J. Ianno, J. L. Huguenin-Love, J. Olejníček, S. A. Darveau, and C. L. Exstrom

2008

The Average Mutual Information Profile as a Genomic Signature, Mark Bauer, Sheldon Schuster, and Khalid Sayood

Grammar-Based Distance in Progressive Multiple Sequence Alignment, David Russell, Hasan H Otu, and Khalid Sayood

Fabrication of nanostructures with high electrical conductivity on silicon surfaces using a laser-assisted scanning tunneling microscope, Kaijun Yi, Z. Y. Yang, and Yongfeng Lu

2007

Method of Calibrating Effects of Field of Classification Search Multi-AOI-System for Easy Changing Angles-of-Incidence In Ellipsometers and The Like, Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, and James D. Welch

Rotating or Rotatable Compensator Spectroscopic Ellipsometer System Including Multiple Element Lenses, Blaine D. Johs, Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam

Broadband Ellipsometer Or Polarimeter System Including at Least One Multiple Element Lens, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam

Combined Spatial Filter and Relay Systems in Rotating Compensator Ellipsometer/Polimeter, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam

Control of Beam Spot Size in Ellipsometer and The Like Systems, Martin M. Liphardt, Blaine D. Johs, John A. Woollam, and James D. Welch

Vacuum ultraviolet optical analysis of spin-cast chitosan films modified by succinic anhydride and glycidyl phenyl ether, William H. Nosal, Daniel W. Thompson, T. E. Tiwald, S. Sarkar, Anuradha Subramanian, and John A. Woollam

Spatial confinement effects in laser-induced breakdown spectroscopy, X. K. Shen, Jian Sun, Hao Ling, and Yongfeng Lu

Spherical silicon-shell photonic band gap structures fabricated by laser-assisted chemical vapor deposition, H. Wang, Z. Y. Yang, and Yongfeng Lu

Spectroscopic Ellipsometer and Polarimeter Systems, John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt, and Galen L. Pfeiffer

Ellipsometer or Polarimeter and The Like System with Multiple Detector Element Detector in Environmental Control Chamber Including Secure Sample Access, John A. Woollam, Gregory K. Pribil, Martin M. Liphardt, and James Welch

Combined Use of Oscillating Means and Ellipsometry to Determine Uncorrelated Effective Thickness and Optical Constants of Material Deposited From a Fluid, John A. Woollam and James D. Welch

Enhanced Raman scattering by self-assembled silica spherical microparticles, Kaijun Yi, H. Wang, Yongfeng Lu, and Z. Y. Yang

2006

KrF excimer laser-assisted combustion-flame deposition of diamond films, Y. X. Han, Hao Ling, and Yongfeng Lu

Optical emission in magnetically confined laser-induced breakdown spectroscopy, X. K. Shen, Yongfeng Lu, T. Gebre, Hao Ling, and Y. X. Han

Catalytical growth of carbon nanotubes/fibers from nanocatalysts prepared by laser pulverization of nickel sulfate, J. Shi, Yongfeng Lu, K. F. Tan, and Xinwei Wang

2005

UV-vis -infrared optical and AFM study of spin-cast chitosan films, W H. Nosal, D W. Thompson, Sabyasachi Sarkar, Anuradha Subramanian, J A. Woollam, and L Yan

Phase-graded deposition of diamond-like carbon on nanotips by near-field induced chemical vapor deposition, J. Shi, Yongfeng Lu, X. Y. Chen, R. S. Cherukuri, K. K. Mendu, H. Wang, and N. Batta

Optical characterization of porous alumina from vacuum ultraviolet to mid-infrared, Daniel W. Thompson, Paul G. Snyder, Leon Castro, Li Yan, Prasuna Kaipa, and John A. Woollam

2004

Annealing and oxidation of silicon oxide films prepared by plasma-enhanced chemical vapor deposition, X. Y. Chen, Yongfeng Lu, L. J. Tang, Y. H. Wu, B. J. Cho, J. R. Dong, and W. D. Song

Optical properties of SiOx nanostructured films by pulsed-laser deposition at different substrate temperatures, X. Y. Chen, Yongfeng Lu, Y. H. Wu, B. J. Cho, W. D. Song, and D. Y. Dai

Parametric investigation of laser nanoimprinting of hemispherical cavity arrays, L. P. Li, Yongfeng Lu, D. W. Doerr, Dennis R. Alexander, and X. Y. Chen

Investigation of Femtosecond Laser-assisted Micromachining of Lithium Niobate, A. Malshe, D. Deshpande, E. Stach, Kamlakar Rajurkar, and Dennis Alexander

Laser-assisted nanoscale deposition of diamond-like carbon films on tungsten tips, J. Shi, Yongfeng Lu, R. S. Cherukuri, K. K. Mendu, D. W. Doerr, Dennis R. Alexander, L. P. Li, and X. Y. Chen

Optical modeling of iridium thin film erosion under oxygen plasma exposure*, Li Yan and John A. Woollam

2003

Mechanisms of photoluminescence from silicon nanocrystals formed by pulsed-laser deposition in argon and oxygen ambient, X. Y. Chen, Yongfeng Lu, Y. H. Wu, B. J. Cho, M. H. Liu, D. Y. Dai, and W. D. Song

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared, James N. Hilfiker, Corey L. Bungay, Ron A. Synowicki, Thomas E. Tiwald, Craig M. Herzinger, Blaine Johs, Greg K. Pribil, and John A. Woollam

2002

Optical constants and roughness study of dc magnetron sputtered iridium films, Li Yan and John A. Woollam

Oxygen plasma effects on optical properties of ZnSe films, Li Yan, John A. Woollam, and Eva Franke

2001

Giant photoresistivity and optically controlled switching in self-assembled nanowires, N. Kouklin, L. Menon, A. Z. Wong, Daniel W. Thompson, J. A. Woollam, P. F. Williams, and S. Bandyopadhyay

Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks, E. Sossna, A. Degen, I. W. Rangelow, M. Drzik, P. Hudek, T. E. Tiwald, and J. A. Woollam

Study of surface chemical changes and erosion rates for CV-1144-O silicone under electron cyclotron resonance oxygen plasma exposure, Li Yan, Xiang Gao, Corey Bungay, and John A. Woollam

Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs, S. Zangooie, Mathias Schubert, Daniel W. Thompson, and J. A. Woollam

Infrared optical properties of aged porous GaAs, S. Zangooie, Mathias Schubert, T. E. Tiwald, and J. A. Woollam

2000

Infrared switching electrochromic devices based on tungsten oxide, E. B. Franke, C. L. Trimble, J. S. Hale, Mathias Schubert, and J. A. Woollam

All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region, E. B. Franke, C. L. Trimble, Mathias Schubert, and J. A. Woollam

In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films, E. Franke, Mathias Schubert, J. A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl

Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry, Eva Franke, C. L. Trimble, M. J. DeVries, J. A. Woollam, Mathias Schubert, and F. Frost

Dielectric tensor for interfaces and individual layers in magnetic multilayer structures, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam

The Electrostatic Interaction of Charged, Dust-Particle Pairs in Plasmas, M. E. Markes and P. F. Williams

Thickness analysis of silicon membranes for stencil masks, E. Sossna, R. Kassing, I. W. Rangelow, C. M. Herzinger, T. E. Tiwald, J. A. Woollam, and Th. Wagner

Self-organization in porous 6H–SiC, S. Zangooie, J. A. Woollam, and H. Arwin

Optical properties of bulk and thin-film SrTiO3 on Si and Pt, Stefan Zollner, A. A. Demkov, R. Liu, P. L. Fejes, R.B. Gregory, Prasad Alluri, J. A. Curless, Z. Yu, J. Ramdani, R. Droopad, T. E. Tiwald, J. N. Hilfiker, and J. A. Woollam

1999

Optical constants of crystalline WO3 deposited by magnetron sputtering, Michael J. DeVries, Chris Trimble, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, and Jeffrey S. Hale

Dielectric tensor for magneto-optic NiMnSb, Xiang Gao, John A. Woollam, Roger D. Kirby, David Sellmyer, C. T. Tanaka, J. Nowak, and Jagadeesh S. Moodera

Variable angle of incidence analysis of magneto-optic multilayers, William A. McGahan, Liang-Yao Chen, and John A. Woollam

Near-band-gap CuPt-order-induced birefringence in Al0.48Ga0.52InP2, Mathias Schubert, Tino Hofmann, Bernd Rheinlander, Ines Pietzonka, Torsten Sass, Volker Gottschalch, and John A. Woollam

Isotropic dielectric functions of highly disordered AlxGa1-xInP (0≤x≤1) lattice matched to GaAs, Mathias Schubert, J. A. Woollam, G. Leibiger, B. Rheinlander, I. Pietzonka, T. Sab, and V. Gottschalch

Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, Stefan Zollner, Jim Christiansen, R. B. Gregory, T. Wetteroth, S. R. Wilson, and Adrian R. Powell

1998

In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures, E. Franke, Mathias Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, Daniel W. Thompson, H. Yao, and J. A. Woollam

Thickness dependence of interfacial magneto-optic effects, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam

Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry, Xiang Gao, Jeff Hale, Scott Heckens, and John A. Woollam

System and Method for Improving Data Acquisition Capability in Spectroscopic Ellipsometers, Steven E. Green, Craig M. Herzinger, Blaine D. Johs, and John A. Woollam

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation, C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson

Magnetic and Magneto-optic Study of a Layered Co/Pt - Dysprosium-Iron-Garnet System, J.M. Meldrim, Roger D. Kirby, M.J. DeVries, John A. Woollam, and David J. Sellmyer

Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry, Thomas E. Tiwald, Daniel W. Thompson, and John A. Woollam

1997

Infrared ellipsometry on hexagonal and cubic boron nitride thin films, E. Franke, H. Neumann, Mathias Schubert, T. E. Tiwald, J. A. Woollam, and J. Hahn

Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range, Eva Franke, Mathias Schubert, Horst Neumann, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, Jens Hahn, and Frank Richter

Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers, Xiang Gao, Darin W. Glenn, Scott Heckens, Daniel W. Thompson, and John A. Woollam

In-situ ellipsometric control of magnetic multilayer deposition (abstract), Xiang Gao, Scott Heckens, and John A. woollam

Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures, Xiang Gao, Daniel W. Thompson, and John A. Woollam

Multiple Order Dispersive Optics System and Method of Use, Blaine D. Johs, Ping He, Steven E. Green, Shakil A. Pittal, and John A. Woollam

Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example, Mathias Schubert, B. Rheinlander, E. Franke, H. Neumann, T. E. Tiwald, and J. A. Woollam

Optical and magneto-optical properties of MnPt3 films (abstract), Kurt W. Wierman, J. N. Hilfiker, Renat F. Sabiryanov, Sitaram Jaswal, Roger D. Kirby, and John A. Woollam

Optical and magneto-optical constants of MnPt3, K. W. Wierman, J. N. Hilfiker, R. F. Sabiryanov, Sitaram S. Jaswal, Roger D. Kirby, and John A. Woollam

1996

United States Patent: System and Method for Compensating Polarization-Dependent Sensitivity of Dispersive Optics in a Rotating Analyzer Ellipsometer System, Steven E. Green, Shakil A. Pittal, Blaine D. Johs, John A. Woollam, David W. Doerr, and Reed A. Christenson

Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, F. G. Celii, Y.-C. Kao, D. Chow, B. Johs, and J. A. Woollam

In situ and ex situ optical characterization of electro deposited magneto-optic materials, James N. Hilfiker, Darin W. Glenn, Scott W. Heckens, John A. Woollam, and Kurt W. Weirman

United States Patent: SYSTEM AND METHOD FOR COMPENSATING POLARIZATION-DEPENDENT SENSITIVITY OF DISPERSIVE OPTICS IN A ROTATING ANALYZER ELLIPSOMETER SYSTEM, Blaine D. Johs, Shakil A. Pittal, Steven E. Green, John A. Woollam, David W. Doerr, and Reed A. Christenson

Growth of diamond by rf plasma-assisted chemical vapor deposition, Duane E. Meyer, Natale J. Ianno, John A. Woollam, A. B. Swartzlander, and A. J. Nelson

Oxygen plasma asher contamination: An analysis of sources and remedies, R. A. Synowicki, Jeffrey S. Hale, William A. McGahan, Natale J. Ianno, and John A. Woollam

1995

InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, B. Johs, and J. A. Woollam

Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis, C. M. Herzinger, H. Yao, Paul G. Snyder, F. G. Celii, Y. C. Kao, B. Johs, and J. A. Woollam

Optical constants of GaxIn1-xP lattice matched to GaAs, Mathias Schubert, V. Gottschalch, Craig M. Herzinger, Huade Yao, Paul G. Snyder, and John A. Woollam

Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs, Paul G. Snyder, Natale J. Ianno, B. Wigert, S. Pittal, B. Johs, and John A. Woollam

1994

Sputtering pressure effects and temperature-dependent magnetism of Co/Pd multilayers, S.Y. Jeong, Z.S. Shan, P. He, J.X. Shen, Y.B. Zhang, John A. Woollam, and David J. Sellmyer

Magneto-optical and structural properties of BiAlDylG/Fe multilayers, J. X. Shen, Kurt W. Wierman, Y. B. Zhang, Roger D. Kirby, John A. Woollam, and David J. Sellmyer

United States Patent: Ellipsometer, John A. Woollam, Blaine D. Johs, David W. Doerr, and Reed A. Christenson

Magnetic and magneto-optic properties of sputtered Co/Ni multilayers, Y. B. Zhang, P. He, John A. Woollam, J. X. Shen, Roger D. Kirby, and David J. Sellmyer

ANISOTROPY AND MAGNETO-OPTICAL PROPERTIES OF SPUTTERED Co/Ni MULTILAYER THIN FILMS, Y.B. Zhang, John A. Woollam, Z.S. Shan, J.X. Shen, and David J. Sellmyer

1993

Nanostructural effects and interface magnetism in Co/Pd multilayers, Ping He, Z.-S. Shan, John A. Woollam, and David J. Sellmyer

Behavior of disordered Co-Pd, Co-Ag, and Co-Mo alloys in multilayer interfaces, Z.S. Shan, Ping He, C. Moore, John A. Woollam, and David J. Sellmyer

Interface magnetism and superparamagnetism of Co/Cu multilayers, Z.S. Shan, S. Nafis, John Woollam, Sy_Hwang Liou, and David J. Sellmyer

Photoellipsometry determination of surface Fermi level in GaAs (100), Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam

Spectroscopic ellipsometry studies of HF treated Si (100) surfaces, Huade Yao, John A. Woollam, and Samual A. Alterovitz

1992

Graded refractive index silicon oxynitride thin film characterized by spectroscopic ellipsometry, Paul G. Snyder, Yi-Ming Xiong, and John A. Woollam

Silicon nitride/silicon oxynitrid/silicon dioxide thin film multilayer characterized by variable angle spectroscopic ellipsometry, Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam

1991

Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films, Liang-Yao Chen, Ping He, S. Nafis, William A. McGahan, John A. Woollam, and David J. Sellmyer

Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers, Ping He, William A. McGahan, S. Nafis, John A. Woollam, Z.S. Shan, Sy_Hwang Liou, F. Sequeda, T. McDaniel, and H. Do

Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures, Ping He, William A. McGahan, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do

Magneto-optic properties of uranium-based compounds, Roger D. Kirby, J. X. Shen, John A. Woollam, and David J. Sellmyer

The process-controlled magnetic properties of nanostructured Co/Ag composite films, Sy_Hwang Liou, S. Malhotra, Z.S. Shan, David J. Sellmyer, S. Nafis, John A. Woollam, C.P. Reed, R.J. DeAngelis, and G.M. Chow

Optical and magneto-optical characterization of TbFeCo thin films in trilayer structures, William A. McGahan, Ping He, Liang-Yao Chen, Sal Bonafede, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do

Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers, S. Nafis, John A. Woollam, Z.S. Shan, and David J. Sellmyer

Temperature dependence of optical properties of GaAs, Huade Yao, Paul G. Snyder, and John A. Woollam

1990

Enhancement of magneto-optical Kerr effects, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam

Kerr effect of two-medium layered systems, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam