Electrical & Computer Engineering, Department of
Department of Electrical and Computer Engineering: Faculty Publications
2004
THERMODYNAMIC MODELING, ENERGY EQUIPARTITION, AND NONCONSERVATION OF ENTROPY FOR DISCRETE-TIME DYNAMICAL SYSTEMS, Wassim H. Haddad, Qing Hui, Sergey G. Nersesov, and Vijaysekhar Chellaboina
Parametric investigation of laser nanoimprinting of hemispherical cavity arrays, L. P. Li, Yongfeng Lu, D. W. Doerr, Dennis R. Alexander, and X. Y. Chen
Investigation of Femtosecond Laser-assisted Micromachining of Lithium Niobate, A. Malshe, D. Deshpande, E. Stach, Kamlakar Rajurkar, and Dennis R. Alexander
Laser-assisted nanoscale deposition of diamond-like carbon films on tungsten tips, J. Shi, Yongfeng Lu, R. S. Cherukuri, K. K. Mendu, D. W. Doerr, Dennis R. Alexander, L. P. Li, and X. Y. Chen
Optical modeling of iridium thin film erosion under oxygen plasma exposure*, Li Yan and John A. Woollam
2003
OPTICAL COMMUNICATIONS BY FREQUENCY CONTENT OF FEMTOSECOND LASER PULSES, Dennis Alexander and Mark L. Rohlfs
Mechanisms of photoluminescence from silicon nanocrystals formed by pulsed-laser deposition in argon and oxygen ambient, X. Y. Chen, Yongfeng Lu, Y. H. Wu, B. J. Cho, M. H. Liu, D. Y. Dai, and W. D. Song
VECTOR DISSIPATIVITY THEORY FOR DISCRETE-TIME LARGE-SCALE NONLINEAR DYNAMICAL SYSTEMS, Wassim M. Haddad, Qing Hui, VijaySekhar Chellaboina, and Sergey Nersesov
Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared, James N. Hilfiker, Corey L. Bungay, Ron A. Synowicki, Thomas E. Tiwald, Craig M. Herzinger, Blaine Johs, Greg K. Pribil, and John A. Woollam
A Shape-Based Approach to Change Detection of Lakes Using Time Series Remote Sensing Images, Jiang Li and Ram M. Narayanan
United States Patent Application Publication: DIVIDE AND CONQUER SYSTEM AND METHOD OF DNA SEQUENCE ASSEMBLY, Khalid Sayood and Hasan H. Otu
2002
Femtosecond Laser Utilization Methods and Apparatus and Method for Producing Nanoparticles, Dennis R. Alexander
Implementation and Validation of Range Imaging on a UHF Radar Wind Profiler, P. B. Chilson, Tian-You Yu, Richard G. Strauch, Andreas Muschinski, and Robert D. Palmer
Shape-based Change Detection and Information Mining in Remote Sensing, Jiang Li and Ram M. Narayanan
An Airborne Low-Cost SAR for Remote Sensing: Hardware Design and Development, Ram Narayanan, Paul C. Cantu, and Xiaojian Xu
A Multiwavelength Airborne Polarimetric Lidar for Vegetation Remote Sensing: Instrumentation and Preliminary Test Results, Songxin Ran and Ram M. Narayanan
Information efficiency in hyperspectral imaging systems, Stephen E. Reichenbach, Luyin Cao, and Ram M. Narayanan
Optical constants and roughness study of dc magnetron sputtered iridium films, Li Yan and John A. Woollam
Oxygen plasma effects on optical properties of ZnSe films, Li Yan, John A. Woollam, and Eva Franke
2001
Statistical evaluation of image quality measures, Ismail Avcibas, Bulent Sankur, and Khalid Sayood
Inverse synthetic aperture radar imaging using a coherent ultrawideband random noise radar system, Daryl C. Bell and Ram M. Narayanan
Aspect sensitivity measurements of polar mesosphere summer echoes using coherent radar imaging, P. B. Chilson, T.-Y. Yu, R. D. Palmer, and S. Kirkwood
Giant photoresistivity and optically controlled switching in self-assembled nanowires, N. Kouklin, L. Menon, A. Z. Wong, Daniel W. Thompson, John A. Woollam, P. F. Williams, and Supriyo Bandyopadhyay
Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks, E. Sossna, A. Degen, I. W. Rangelow, M. Drzik, P. Hudek, T. E. Tiwald, and John A. Woollam
Polarimetric Processing of Coherent Random Noise Radar Data for Buried Object Detection, Yi Xu, Ram M. Narayanan, Xiojian Xu, and John O. Curtis
Study of surface chemical changes and erosion rates for CV-1144-O silicone under electron cyclotron resonance oxygen plasma exposure, Li Yan, Xiang Gao, Corey Bungay, and John A. Woollam
Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs, S. Zangooie, Mathias Schubert, Daniel W. Thompson, and John A. Woollam
Infrared optical properties of aged porous GaAs, S. Zangooie, Mathias Schubert, T. E. Tiwald, and John A. Woollam
2000
Ambiguity Function of an Ultrawideband Random Noise Radar, Muhammad Dawood and Ram M. Narayanan
Infrared switching electrochromic devices based on tungsten oxide, E. B. Franke, C. L. Trimble, J. S. Hale, Mathias Schubert, and John A. Woollam
All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region, E. B. Franke, C. L. Trimble, Mathias Schubert, and John A. Woollam
In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films, E. Franke, Mathias Schubert, John A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl
Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry, Eva Franke, C. L. Trimble, M. J. DeVries, John A. Woollam, Mathias Schubert, and F. Frost
Dielectric tensor for interfaces and individual layers in magnetic multilayer structures, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam
SAR Imaging Using Fully Random Bandlimited Signals, Dmitriy S. Garmatyuk and Ram M. Narayanan
The Electrostatic Interaction of Charged, Dust-Particle Pairs in Plasmas, M. E. Markes and P. F. Williams
Doppler Estimation Using a Coherent Ultrawide-Band Random Noise Radar, Ram M. Narayanan and Muhammad Dawood
Class Project on Airborne Radar System Design and Development for Remote Sensing Applications, Ram M. Narayanan and K. Jon Ranson
Thickness analysis of silicon membranes for stencil masks, E. Sossna, R. Kassing, I. W. Rangelow, C. M. Herzinger, T. E. Tiwald, John A. Woollam, and Th. Wagner
A Comparative Study of UWB FOPEN Radar Imaging Using Step-Frequency and Random Noise Waveforms, Xiaojian Xu and Ram M. Narayanan
Self-organization in porous 6H–SiC, S. Zangooie, John A. Woollam, and H. Arwin
Optical properties of bulk and thin-film SrTiO3 on Si and Pt, Stefan Zollner, A. A. Demkov, R. Liu, P. L. Fejes, R.B. Gregory, Prasad Alluri, J. A. Curless, Z. Yu, J. Ramdani, R. Droopad, T. E. Tiwald, J. N. Hilfiker, and John A. Woollam
1999
Doppler Measurements Using a Coherent Ultrawideband Random Noise Radar, Muhammad Dawood and Ram M. Narayanan
Optical constants of crystalline WO3 deposited by magnetron sputtering, Michael J. DeVries, Chris Trimble, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, and Jeffrey S. Hale
Dielectric tensor for magneto-optic NiMnSb, Xiang Gao, John A. Woollam, Roger D. Kirby, David J. Sellmyer, C. T. Tanaka, J. Nowak, and Jagadeesh S. Moodera
SYSTEM AND METHOD FOR IMPROVING DATA ACQUISISTION CAPABILITY IN SPECTROSCOPIC ROTATABLE ELEMENT, ROTATING ELEMENT, MODULATION ELEMENT, AND OTHER ELLIPSOMETER AND POLARIMETER AND THE LIKE SYSTEMS, Steven E. Green, Craig M. Heringer, Blaine D. Johs, John A. Woollam, and Stephen P. Ducharme
Variable angle of incidence analysis of magneto-optic multilayers, William A. McGahan, Liang-Yao Chen, and John A. Woollam
Near-band-gap CuPt-order-induced birefringence in Al0.48Ga0.52InP2, Mathias Schubert, Tino Hofmann, Bernd Rheinlander, Ines Pietzonka, Torsten Sass, Volker Gottschalch, and John A. Woollam
Isotropic dielectric functions of highly disordered AlxGa1-xInP (0≤x≤1) lattice matched to GaAs, Mathias Schubert, John A. Woollam, G. Leibiger, B. Rheinlander, I. Pietzonka, T. Sab, and V. Gottschalch
Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, Stefan Zollner, Jim Christiansen, R. B. Gregory, T. Wetteroth, S. R. Wilson, and Adrian R. Powell
Complete maps of the aspect sensitivity of VHF atmospheric radar echoes, R. M. Worthington, R. D. Palmer, and S. Fukao
1998
APPARATUS AND METHOD FOR DETECTION AND CONCENTRATION MEASUREMENT OF TRACE METALS USING LASER INDUCED BREAKDOWN SPECTROSCOPY, Dennis R. Alexander
A New Radiosonde System for Profiling the Lower Troposphere, Brian R Corner and Robert D. Palmer
In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures, E. Franke, Mathias Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, Daniel W. Thompson, H. Yao, and John A. Woollam
Thickness dependence of interfacial magneto-optic effects, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam
Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry, Xiang Gao, Jeff Hale, Scott Heckens, and John A. Woollam
System and Method for Improving Data Acquisition Capability in Spectroscopic Ellipsometers, Steven E. Green, Craig M. Herzinger, Blaine D. Johs, and John A. Woollam
Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation, C. M. Herzinger, B. Johs, W. A. McGahan, John A. Woollam, and W. Paulson
Magnetic and Magneto-optic Study of a Layered Co/Pt - Dysprosium-Iron-Garnet System, J.M. Meldrim, Roger D. Kirby, M.J. DeVries, John A. Woollam, and David J. Sellmyer
Design, performance, and applications of a coherent ultra-wideband random noise radar, Ram M. Narayanan, Yi Xu, Paul D. Hoffmeyer, and John O. Curtis
ELECTROMAGNETICBEAMDIRECTING MEANS-SAMPLEANALYSS SYSTEM STAGE, AND METHOD OF USE, Daniel W. Thompson, Darin W. Glenn, and John A. Woollam
INFRARED ELLPSOMETER/ POLARMETER SYSTEM, METHOD OF CALIBRATION, AND USE THEREOF, Daniel W. Thompson and Blaine D. Johs
ELECTROMAGNETIC BEAM DIRECTING MEANS-SAMPLE ANALYSIS SYSTEM STAGE, AND METHOD OF USE, Daniel W. Thomspon, Darin W. Glenn, and John A. Woollam
Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, and John A. Woollam
SYSTEM AND METHOD FOR PERFORMING OPTICAL CODE DIVISION MULTIPLE ACCESS COMMUNICATION USING BPOLAR CODES, James F. Young, Benhaam Aazhnag, and Lim Nguyen
1997
High-bandwidth attitude jitter determination for pointing and tracking systems, Marcelo C. Algrain
Frequency-Mixing Detection of Polarization-Modulated Light Using Different Periodic Analyzers, R.M.A. Azzam
An Intercomparison of Two Tunable Diode Laser Spectrometers Used for Eddy Correlation Measurements of Methane Flux in a Prairie Wetland, David P. Billesbach, Joon Kim, R.J. Clement, S.B Verman, and F.G. Ullman
Infrared ellipsometry on hexagonal and cubic boron nitride thin films, E. Franke, H. Neumann, Mathias Schubert, T. E. Tiwald, John A. Woollam, and J. Hahn
Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range, Eva Franke, Mathias Schubert, Horst Neumann, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, Jens Hahn, and Frank Richter
Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers, Xiang Gao, Darin W. Glenn, Scott Heckens, Daniel W. Thompson, and John A. Woollam
In-situ ellipsometric control of magnetic multilayer deposition (abstract), Xiang Gao, Scott Heckens, and John A. Woollam
Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures, Xiang Gao, Daniel W. Thompson, and John A. Woollam
Multiple Order Dispersive Optics System and Method of Use, Blaine D. Johs, Ping He, Steven E. Green, Shakil A. Pittal, and John A. Woollam
Estimation of Surface Snow Properties Using Combined Millimeter-Wave Backscatter and Near-Infrared Reflectance Measurements, Ram M. Narayanan and Sandy R. Jackson
Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example, Mathias Schubert, B. Rheinlander, E. Franke, H. Neumann, T. E. Tiwald, and John A. Woollam
Optical and magneto-optical properties of MnPt3 films (abstract), Kurt W. Wierman, J. N. Hilfiker, Renat F. Sabiryanov, Sitaram Jaswal, Roger D. Kirby, and John A. Woollam
Optical and magneto-optical constants of MnPt3, K. W. Wierman, J. N. Hilfiker, R. F. Sabiryanov, Sitaram S. Jaswal, Roger D. Kirby, and John A. Woollam
1996
Controlling three-axis attitude rates on a pointing system using nonlinear observer and two axis measurements, Marcelo C. Algrain
Trade-off study and computer simulation for assessing spacecraft pointing accuracy and stability capabilities, Marcelo C. Algrain and Richard M. Powers
Application of inversions to lossless image compression, Ziya Arnavut
United States Patent: System and Method for Compensating Polarization-Dependent Sensitivity of Dispersive Optics in a Rotating Analyzer Ellipsometer System, Steven E. Green, Shakil A. Pittal, Blaine D. Johs, John A. Woollam, David W. Doerr, and Reed A. Christenson
Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, F. G. Celii, Y.-C. Kao, D. Chow, B. Johs, and John A. Woollam
In situ and ex situ optical characterization of electro deposited magneto-optic materials, James N. Hilfiker, Darin W. Glenn, Scott W. Heckens, John A. Woollam, and Kurt W. Weirman
United States Patent: SYSTEM AND METHOD FOR COMPENSATING POLARIZATION-DEPENDENT SENSITIVITY OF DISPERSIVE OPTICS IN A ROTATING ANALYZER ELLIPSOMETER SYSTEM, Blaine D. Johs, Shakil A. Pittal, Steven E. Green, John A. Woollam, David W. Doerr, and Reed A. Christenson
Growth of diamond by rf plasma-assisted chemical vapor deposition, Duane E. Meyer, Natale J. Ianno, John A. Woollam, A. B. Swartzlander, and A. J. Nelson
Oxygen plasma asher contamination: An analysis of sources and remedies, R. A. Synowicki, Jeffrey S. Hale, William A. McGahan, Natale J. Ianno, and John A. Woollam
ELLIPSOMETER/POLARMETERBASED PROCESS MONITOR AND CONTROL SYSTEM SUITABLE FOR SIMULTANEOUS RETROFIT ON MOLECULAR BEAM EPITAXY SYSTEM RHEED/LEED INTERFACE SYSTEM, AND METHOD OF USE, John A. Woollam, Blaine D. Johs, and Peter P. Chow
ELLIPSOMETER/POLARMETER BASED PROCESS MONITOR AND CONTROL SYSTEM SUITABLE FOR SIMULTANEOUS RETROFIT ON MOLECULAR BEAM EPTAXY SYSTEM RHEED/LEED INTERFACE SYSTEM, AND METHOD OF USE, John A. Woollam, Blaine D. Johs, and Peter P. Chow
1995
Novel Kalman filtering method for the suppression of gyroscope noise effects in pointing and tracking systems, Marcelo C. Aigrain
APPARATUS FOR FORMING FINE PARTICLES, Dennis R. Alexander
InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, B. Johs, and John A. Woollam
Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis, C. M. Herzinger, H. Yao, Paul G. Snyder, F. G. Celii, Y. C. Kao, B. Johs, and John A. Woollam
Losslees compression of RGB color images, Nasir D. Memon and Khalid Sayood
Optical constants of GaxIn1-xP lattice matched to GaAs, Mathias Schubert, V. Gottschalch, Craig M. Herzinger, Huade Yao, Paul G. Snyder, and John A. Woollam
Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs, Paul G. Snyder, Natale J. Ianno, B. Wigert, S. Pittal, B. Johs, and John A. Woollam
1994
Complex index-of-refraction measurements for RP-1 liquid rocket fuel, Dennis R. Alexander, Ramu Kaiwala, Robert D. Kubik, and Scott A. Schaub
Sputtering pressure effects and temperature-dependent magnetism of Co/Pd multilayers, S.Y. Jeong, Z.S. Shan, P. He, J.X. Shen, Y.B. Zhang, John A. Woollam, and David J. Sellmyer
Field Measurements of Natural and Artificial Targets Using a Mid-Infrared Laser Reflectance Sensor, Ram M. Narayanan and Steven E. Green