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2000

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Optical properties of bulk and thin-film SrTiO3 on Si and Pt, Stefan Zollner, A. A. Demkov, R. Liu, P. L. Fejes, R.B. Gregory, Prasad Alluri, J. A. Curless, Z. Yu, J. Ramdani, R. Droopad, T. E. Tiwald, J. N. Hilfiker, and John A. Woollam

1999

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Doppler Measurements Using a Coherent Ultrawideband Random Noise Radar, Muhammad Dawood and Ram M. Narayanan

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Optical constants of crystalline WO3 deposited by magnetron sputtering, Michael J. DeVries, Chris Trimble, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, and Jeffrey S. Hale

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Dielectric tensor for magneto-optic NiMnSb, Xiang Gao, John A. Woollam, Roger D. Kirby, David J. Sellmyer, C. T. Tanaka, J. Nowak, and Jagadeesh S. Moodera

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Variable angle of incidence analysis of magneto-optic multilayers, William A. McGahan, Liang-Yao Chen, and John A. Woollam

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Near-band-gap CuPt-order-induced birefringence in Al0.48Ga0.52InP2, Mathias Schubert, Tino Hofmann, Bernd Rheinlander, Ines Pietzonka, Torsten Sass, Volker Gottschalch, and John A. Woollam

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Isotropic dielectric functions of highly disordered AlxGa1-xInP (0≤x≤1) lattice matched to GaAs, Mathias Schubert, John A. Woollam, G. Leibiger, B. Rheinlander, I. Pietzonka, T. Sab, and V. Gottschalch

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Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, Stefan Zollner, Jim Christiansen, R. B. Gregory, T. Wetteroth, S. R. Wilson, and Adrian R. Powell

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Complete maps of the aspect sensitivity of VHF atmospheric radar echoes, R. M. Worthington, R. D. Palmer, and S. Fukao

1998

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APPARATUS AND METHOD FOR DETECTION AND CONCENTRATION MEASUREMENT OF TRACE METALS USING LASER INDUCED BREAKDOWN SPECTROSCOPY, Dennis R. Alexander

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In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures, E. Franke, Mathias Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, Daniel W. Thompson, H. Yao, and John A. Woollam

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Thickness dependence of interfacial magneto-optic effects, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam

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Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry, Xiang Gao, Jeff Hale, Scott Heckens, and John A. Woollam

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System and Method for Improving Data Acquisition Capability in Spectroscopic Ellipsometers, Steven E. Green, Craig M. Herzinger, Blaine D. Johs, and John A. Woollam

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Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation, C. M. Herzinger, B. Johs, W. A. McGahan, John A. Woollam, and W. Paulson

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Magnetic and Magneto-optic Study of a Layered Co/Pt - Dysprosium-Iron-Garnet System, J.M. Meldrim, Roger D. Kirby, M.J. DeVries, John A. Woollam, and David J. Sellmyer

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Design, performance, and applications of a coherent ultra-wideband random noise radar, Ram M. Narayanan, Yi Xu, Paul D. Hoffmeyer, and John O. Curtis

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ELECTROMAGNETICBEAMDIRECTING MEANS-SAMPLEANALYSS SYSTEM STAGE, AND METHOD OF USE, Daniel W. Thompson, Darin W. Glenn, and John A. Woollam

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INFRARED ELLPSOMETER/ POLARMETER SYSTEM, METHOD OF CALIBRATION, AND USE THEREOF, Daniel W. Thompson and Blaine D. Johs

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Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, and John A. Woollam

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SYSTEM AND METHOD FOR PERFORMING OPTICAL CODE DIVISION MULTIPLE ACCESS COMMUNICATION USING BPOLAR CODES, James F. Young, Benhaam Aazhnag, and Lim Nguyen

1997

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High-bandwidth attitude jitter determination for pointing and tracking systems, Marcelo C. Algrain

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Frequency-Mixing Detection of Polarization-Modulated Light Using Different Periodic Analyzers, R.M.A. Azzam

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Infrared ellipsometry on hexagonal and cubic boron nitride thin films, E. Franke, H. Neumann, Mathias Schubert, T. E. Tiwald, John A. Woollam, and J. Hahn

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Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range, Eva Franke, Mathias Schubert, Horst Neumann, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, Jens Hahn, and Frank Richter

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Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers, Xiang Gao, Darin W. Glenn, Scott Heckens, Daniel W. Thompson, and John A. Woollam

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In-situ ellipsometric control of magnetic multilayer deposition (abstract), Xiang Gao, Scott Heckens, and John A. Woollam

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Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures, Xiang Gao, Daniel W. Thompson, and John A. Woollam

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Multiple Order Dispersive Optics System and Method of Use, Blaine D. Johs, Ping He, Steven E. Green, Shakil A. Pittal, and John A. Woollam

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Estimation of Surface Snow Properties Using Combined Millimeter-Wave Backscatter and Near-Infrared Reflectance Measurements, Ram M. Narayanan and Sandy R. Jackson

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Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example, Mathias Schubert, B. Rheinlander, E. Franke, H. Neumann, T. E. Tiwald, and John A. Woollam

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Optical and magneto-optical properties of MnPt3 films (abstract), Kurt W. Wierman, J. N. Hilfiker, Renat F. Sabiryanov, Sitaram Jaswal, Roger D. Kirby, and John A. Woollam

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Optical and magneto-optical constants of MnPt3, K. W. Wierman, J. N. Hilfiker, R. F. Sabiryanov, Sitaram S. Jaswal, Roger D. Kirby, and John A. Woollam

1996

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Controlling three-axis attitude rates on a pointing system using nonlinear observer and two axis measurements, Marcelo C. Algrain

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Trade-off study and computer simulation for assessing spacecraft pointing accuracy and stability capabilities, Marcelo C. Algrain and Richard M. Powers

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Application of inversions to lossless image compression, Ziya Arnavut

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United States Patent: System and Method for Compensating Polarization-Dependent Sensitivity of Dispersive Optics in a Rotating Analyzer Ellipsometer System, Steven E. Green, Shakil A. Pittal, Blaine D. Johs, John A. Woollam, David W. Doerr, and Reed A. Christenson

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Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, F. G. Celii, Y.-C. Kao, D. Chow, B. Johs, and John A. Woollam

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In situ and ex situ optical characterization of electro deposited magneto-optic materials, James N. Hilfiker, Darin W. Glenn, Scott W. Heckens, John A. Woollam, and Kurt W. Weirman

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United States Patent: SYSTEM AND METHOD FOR COMPENSATING POLARIZATION-DEPENDENT SENSITIVITY OF DISPERSIVE OPTICS IN A ROTATING ANALYZER ELLIPSOMETER SYSTEM, Blaine D. Johs, Shakil A. Pittal, Steven E. Green, John A. Woollam, David W. Doerr, and Reed A. Christenson

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Growth of diamond by rf plasma-assisted chemical vapor deposition, Duane E. Meyer, Natale J. Ianno, John A. Woollam, A. B. Swartzlander, and A. J. Nelson

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Oxygen plasma asher contamination: An analysis of sources and remedies, R. A. Synowicki, Jeffrey S. Hale, William A. McGahan, Natale J. Ianno, and John A. Woollam

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ELLIPSOMETER/POLARMETERBASED PROCESS MONITOR AND CONTROL SYSTEM SUITABLE FOR SIMULTANEOUS RETROFIT ON MOLECULAR BEAM EPITAXY SYSTEM RHEED/LEED INTERFACE SYSTEM, AND METHOD OF USE, John A. Woollam, Blaine D. Johs, and Peter P. Chow

1995

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Novel Kalman filtering method for the suppression of gyroscope noise effects in pointing and tracking systems, Marcelo C. Aigrain

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APPARATUS FOR FORMING FINE PARTICLES, Dennis R. Alexander

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InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, B. Johs, and John A. Woollam

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Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis, C. M. Herzinger, H. Yao, Paul G. Snyder, F. G. Celii, Y. C. Kao, B. Johs, and John A. Woollam

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Losslees compression of RGB color images, Nasir D. Memon and Khalid Sayood

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Optical constants of GaxIn1-xP lattice matched to GaAs, Mathias Schubert, V. Gottschalch, Craig M. Herzinger, Huade Yao, Paul G. Snyder, and John A. Woollam

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Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs, Paul G. Snyder, Natale J. Ianno, B. Wigert, S. Pittal, B. Johs, and John A. Woollam

1994

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Complex index-of-refraction measurements for RP-1 liquid rocket fuel, Dennis R. Alexander, Ramu Kaiwala, Robert D. Kubik, and Scott A. Schaub

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Sputtering pressure effects and temperature-dependent magnetism of Co/Pd multilayers, S.Y. Jeong, Z.S. Shan, P. He, J.X. Shen, Y.B. Zhang, John A. Woollam, and David J. Sellmyer

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Field Measurements of Natural and Artificial Targets Using a Mid-Infrared Laser Reflectance Sensor, Ram M. Narayanan and Steven E. Green

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Magneto-optical and structural properties of BiAlDylG/Fe multilayers, J. X. Shen, Kurt W. Wierman, Y. B. Zhang, Roger D. Kirby, John A. Woollam, and David J. Sellmyer

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United States Patent: Ellipsometer, John A. Woollam, Blaine D. Johs, David W. Doerr, and Reed A. Christenson

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Magnetic and magneto-optic properties of sputtered Co/Ni multilayers, Y. B. Zhang, P. He, John A. Woollam, J. X. Shen, Roger D. Kirby, and David J. Sellmyer

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ANISOTROPY AND MAGNETO-OPTICAL PROPERTIES OF SPUTTERED Co/Ni MULTILAYER THIN FILMS, Y.B. Zhang, John A. Woollam, Z.S. Shan, J.X. Shen, and David J. Sellmyer

1993

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Gyroless line-of-sight stabilization for pointing and tracking systems, Marcelo C. Aigrain

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Simple high-quality lossy image coding scheme, Shaolin Bi and Khalid Sayood

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Nanostructural effects and interface magnetism in Co/Pd multilayers, Ping He, Z.-S. Shan, John A. Woollam, and David J. Sellmyer

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Behavior of disordered Co-Pd, Co-Ag, and Co-Mo alloys in multilayer interfaces, Z.S. Shan, Ping He, C. Moore, John A. Woollam, and David J. Sellmyer

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Interface magnetism and superparamagnetism of Co/Cu multilayers, Z.S. Shan, S. Nafis, John A. Woollam, Sy_Hwang Liou, and David J. Sellmyer

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Photoellipsometry determination of surface Fermi level in GaAs (100), Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam

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Spectroscopic ellipsometry studies of HF treated Si (100) surfaces, Huade Yao, John A. Woollam, and Samual A. Alterovitz

1992

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Model-based target recognition using laser radar imagery, Robert Y. Li

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Graded refractive index silicon oxynitride thin film characterized by spectroscopic ellipsometry, Paul G. Snyder, Yi-Ming Xiong, and John A. Woollam

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Silicon nitride/silicon oxynitrid/silicon dioxide thin film multilayer characterized by variable angle spectroscopic ellipsometry, Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam

1991

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FORMING FINE PARTICLES, Dennis R. Alexander

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Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films, Liang-Yao Chen, Ping He, S. Nafis, William A. McGahan, John A. Woollam, and David J. Sellmyer

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Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers, Ping He, William A. McGahan, S. Nafis, John A. Woollam, Z.S. Shan, Sy_Hwang Liou, F. Sequeda, T. McDaniel, and H. Do

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Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures, Ping He, William A. McGahan, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do

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Magneto-optic properties of uranium-based compounds, Roger D. Kirby, J. X. Shen, John A. Woollam, and David J. Sellmyer

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The process-controlled magnetic properties of nanostructured Co/Ag composite films, Sy_Hwang Liou, S. Malhotra, Z.S. Shan, David J. Sellmyer, S. Nafis, John A. Woollam, C.P. Reed, R.J. DeAngelis, and G.M. Chow

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Optical and magneto-optical characterization of TbFeCo thin films in trilayer structures, William A. McGahan, Ping He, Liang-Yao Chen, Sal Bonafede, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do

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Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers, S. Nafis, John A. Woollam, Z.S. Shan, and David J. Sellmyer

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Temperature dependence of optical properties of GaAs, Huade Yao, Paul G. Snyder, and John A. Woollam

1990

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Enhancement of magneto-optical Kerr effects, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam

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Kerr effect of two-medium layered systems, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam

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Ellipsometric analysis of computer disk structures, Ping He, Bhola N. De, Laing-Yao Chen, Yong Zhao, John A. Woollam, Mark Miller, and Edward Simpson

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Pulsed laser annealing of GaAs implanted with Se and Si, Andrzej Rys, Yanan Shieh, Alvin Compann, Huade Yao, and Ajit Bhat

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Modeling AIxGa1-xAs optical constants as functions of composition, Paul G. Snyder, John A. Woollam, Samuel A. Alterovitz, and Blaine D. Johs

1989

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Generalized model for the optical absorption edge in a-Si:H, T. Datta and John A. Woollam

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Optical-absorption edge and disorder effects in hydrogenated amorphous diamondlike carbon films, T. Datta, John A. Woollam, and W. Notohamiprodjo

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Ellipsometric study of Al2O3/Ag/Si and SiO2/Ag/quartz ashed in an oxygen plasma, Bhola N. De and John A. Woollam

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Preparation of high TcTl-Ba-Ca-Cu-O thin films by pulsed laser evaporation and Tl2O3 vapor processing, B. Johs, D. Thompson, N.J. Ianno, John A. Woollam, Sy_Hwang Liou, A.M. Hermann, Z.Z. Sheng, W. Kiehl, O. Shams, X. Fei, L. Sheng, and Y.H. Liu

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Highly oriented Tl2Ba2Ca2Cu3O10 thin films by pulsed laser evaporation, Sy_Hwang Liou, K.D. Aylesworth, N.J. Ianno, B. Johs, D. Thompson, D. Meyer, John A. Woollam, and Colleen Berry

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Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures, William A. McGahan, Liang-Yao Chen, Z. S. Shan, David J. Sellmyer, and John A. Woollam

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Optical- and magnets-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayer, William A. McGahan, Z. S. Shan, Alan M. Massengale, and Thomas E. Tiwald

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Radio-frequency plasma chemical vapor deposition growth of diamond, Duane E. Meyer, Rodney O. Dillon, and John A. Woollam

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Theoretical model for the images formed by a spherical particle in a coherent imaging system: comparison, Scott Alan Schaub, D. R. Alexander, and J. P. Barton

1988

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Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatings, Kazem Memarzadeh, John A. Woollam, and Abe Belkind

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Thin-film hermeticity: A quantitative analysis of diamond-like carbon using variable angle spectroscopic ellipsometry, S. Orzeszko, Bhola N. De, John A. Woollam, John J. Pouch, Samuel A. Alterovitz, and David C. Ingram

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Variable angle spectroscopic magneto-optics and ellipsometry: Application to DyCo multilayers, Thomas E. Tiwald, William A. McGahan, Z. S. Shan, Alan M. Massengale, and John A. Woollam

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Ellipsometric and magneto-optic properties of sputtered dysprosium-iron multilayers, Thomas E. Tiwald, John A. Woollam, and David J. Sellmyer

1986

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Thermal and structural stability of cosputtered amorphous TaxCu1-x alloy thin films on GaAs, J.E. Oh, John A. Woollam, K.D. Aylesworth, David J. Sellmyer, and J.J. Pouch

1985

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Study of Mo, Au, and Ni Implanted Molybdenum Laser Mirrors By Spectroscopic Ellipsometry, Paul G. Snyder, George H. Bu-Abbud, Jae Oh, John A. Woollam, David Poker, D. E. Aspnes, David Ingram, and Peter Pronko

1983

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Interfacial Electrical Properties of Ion-Beam Sputter Deposited Amorphous Carbon on Silicon, A. Azim Khan, John A. Woollam, Y. Chung, and B. Banks

1980

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ELECTRONIC PROPERTIES OF METAL CHLORIDE INTERCALANTS OF GRAPHITE*, **, John A. Woollam, M. B. Dowell, A. Yavrouian, A. G. Lozier, and G. Matulka

1978

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ATOMIC HYDROGEN STORAGE METHOD AND APPARATUS, John A. Woollam

1977

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SiO2-Si Film-Substrate Single-Reflection Retarders For Different Mercury Spectral Lines, A.R.M. Zaghloul and R.M.A Azzam