Journal Publications
1983
A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems, Sharad C. Seth and Lester Lipsky
1982
Fault Coverage Requirement in Production Testing of LSI Circuits, Vishwani D. Agrawal, Sharad C. Seth, and Prathima Agrawal
1981
Forecasting Reject Rate of Tested LSI Chips, Sharad C. Seth and Vishwani D. Agrawal
A Graph Model for Pattern-Sensitive Faults in Random Access Memories, Sharad C. Seth and K. Narayanaswamy
1978
On Combinational Networks with Restricted Fan-Out, K. L. Kodandapani and Sharad C. Seth
1977
Diagnosis of Faults in Linear Tree Networks, Sharad C. Seth and K. L. Kodandapani