Journal Publications

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1988

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What is the Path to Fast Fault Simulation?, Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad Seth, and John Waicukauski

1987

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Decoding Substitution Ciphers by Means of Word Matching with Application to OCR, George Nagy, Sharad C. Seth, and Kent Einspahr

1984

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An Analysis of the Use of Rademacher-Walsh Spectrum in Compact Testing, Ten-Chuan Hsiao and Sharad C. Seth

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Characterizing the LSI Yield Equation from Wafer Test Data, Sharad C. Seth and Vishwani D. Agrawal

1983

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Candide's Practical Principles of Experimental Pattern Recognition, George Nagy

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A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems, Sharad C. Seth and Lester Lipsky

1982

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Fault Coverage Requirement in Production Testing of LSI Circuits, Vishwani D. Agrawal, Sharad C. Seth, and Prathima Agrawal

1981

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Forecasting Reject Rate of Tested LSI Chips, Sharad C. Seth and Vishwani D. Agrawal

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A Graph Model for Pattern-Sensitive Faults in Random Access Memories, Sharad C. Seth and K. Narayanaswamy

1978

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On Combinational Networks with Restricted Fan-Out, K. L. Kodandapani and Sharad C. Seth

1977

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Diagnosis of Faults in Linear Tree Networks, Sharad C. Seth and K. L. Kodandapani