Journal Publications

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1993

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Generating Tests for Delay Faults in Nonscan Circuits, Prathima Agrawal, Vishwani D. Agrawal, and Sharad C. Seth

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Accurate Computation of Field Reject Ratio Based on Fault Latency, Dharamvir Das, Sharad C. Seth, and Vishwani D. Agrawal

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Syntactic Segmentation and Labeling of Digitized Pages from Technical Journals, Mukkai Krishnamoorthy, George Nagy, Sharad C. Seth, and Mahesh Viswanathan

1992

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PPMB: A Partial-Multiple-Bus Multiprocessor Architecture with Improved Cost-Effectiveness, Hong Jiang and Kenneth C. Smith

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A Prototype Document Image Analysis System for Technical Journals, George Nagy, Sharad C. Seth, and Mahesh Viswanathan

1991

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Estimating The Quality Of Manufactured Digital Sequential Circuits, Dharam Vir Das, Sharad Seth, and Vishwani Agrawal

1990

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High-Level Microprogramming: An Optimising C Compiler for a Processing Element of a CAD Accelerator, Paul Kenyon, Prathima Agrawal, and Sharad Seth

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A Statistical Theory of Digital Circuit Testability, Sharad C. Seth, Vishwani D. Agrawal, and Hassan Farhat

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An Experimental Study on Reject Ratio Prediction for VLSl Circuits: Kokomo Revisited, Dharam Vir Das, Sharad Seth, Paul T. Wagner, John Anderson, and Vishwani Agrawal

1989

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Design of Parity Testable Combinational Circuits, Bhargab B. Bhattacharya and Sharad C. Seth

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Testability Analysis of Synchronous Sequential Circuits Based On Structural Data, Raghu V. Hudli and Sharad Seth

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Signal Probabilities in AND-OR Trees, Lester Lipsky and Sharad C. Seth

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A Theory of Testability with Application to Fault Coverage Analysis, Sharad Seth, Vishwani Agrawal, and Hassan Farhat

1988

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What is the Path to Fast Fault Simulation?, Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad Seth, and John Waicukauski

1987

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Decoding Substitution Ciphers by Means of Word Matching with Application to OCR, George Nagy, Sharad C. Seth, and Kent Einspahr

1984

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An Analysis of the Use of Rademacher-Walsh Spectrum in Compact Testing, Ten-Chuan Hsiao and Sharad C. Seth

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Characterizing the LSI Yield Equation from Wafer Test Data, Sharad C. Seth and Vishwani D. Agrawal

1983

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Candide's Practical Principles of Experimental Pattern Recognition, George Nagy

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A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems, Sharad C. Seth and Lester Lipsky

1982

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Fault Coverage Requirement in Production Testing of LSI Circuits, Vishwani D. Agrawal, Sharad C. Seth, and Prathima Agrawal

1981

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Forecasting Reject Rate of Tested LSI Chips, Sharad C. Seth and Vishwani D. Agrawal

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A Graph Model for Pattern-Sensitive Faults in Random Access Memories, Sharad C. Seth and K. Narayanaswamy

1978

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On Combinational Networks with Restricted Fan-Out, K. L. Kodandapani and Sharad C. Seth

1977

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Diagnosis of Faults in Linear Tree Networks, Sharad C. Seth and K. L. Kodandapani