1995
Accessing Earth System Science Data and Applications Through High-Bandwidth Networks, R. Vetter, M. Ali, M. Daily, J. Gabrynowic, Sunil G. Narumalani, K. Nygard, W. Perrizo, P. Ram, S. Reichenbach, G. A. Seielstad, and W. White
1994
Aspect angle estimation of targets in forward looking infrared images using the model-based vision approach, Prabir Bhattacharya
1993
Generating Tests for Delay Faults in Nonscan Circuits, Prathima Agrawal, Vishwani D. Agrawal, and Sharad C. Seth
Accurate Computation of Field Reject Ratio Based on Fault Latency, Dharamvir Das, Sharad C. Seth, and Vishwani D. Agrawal
Syntactic Segmentation and Labeling of Digitized Pages from Technical Journals, Mukkai Krishnamoorthy, George Nagy, Sharad C. Seth, and Mahesh Viswanathan
Simple method for enhancing the performance of lossy plus lossless image compression schemes, Nasir D. Memon, Khalid Sayood, and Spyros S. Magliveras
Natural shape detection based on principal component analysis, Ashok Samal and Prasana A. Iyengar
1992
PPMB: A Partial-Multiple-Bus Multiprocessor Architecture with Improved Cost-Effectiveness, Hong Jiang and Kenneth C. Smith
A Prototype Document Image Analysis System for Technical Journals, George Nagy, Sharad C. Seth, and Mahesh Viswanathan
1991
Estimating The Quality Of Manufactured Digital Sequential Circuits, Dharam Vir Das, Sharad C. Seth, and Vishwani Agrawal
1990
High-Level Microprogramming: An Optimising C Compiler for a Processing Element of a CAD Accelerator, Paul Kenyon, Prathima Agrawal, and Sharad C. Seth
Characterizing digital image acquisition devices, Stephen E. Reichenbach, Stephen K. Park, and Ramkumar Narayanswamy
A Statistical Theory of Digital Circuit Testability, Sharad C. Seth, Vishwani D. Agrawal, and Hassan Farhat
An Experimental Study on Reject Ratio Prediction for VLSl Circuits: Kokomo Revisited, Dharam Vir Das, Sharad C. Seth, Paul T. Wagner, John Anderson, and Vishwani Agrawal
1989
Design of Parity Testable Combinational Circuits, Bhargab B. Bhattacharya and Sharad C. Seth
A GENERALIZED FRATTINI SUBGROUP OF A FINITE GROUP, Prabir Bhattacharya and N. P. Mukherjee
Testability Analysis of Synchronous Sequential Circuits Based On Structural Data, Raghu V. Hudli and Sharad C. Seth
Signal Probabilities in AND-OR Trees, Lester Lipsky and Sharad C. Seth
A Theory of Testability with Application to Fault Coverage Analysis, Sharad C. Seth, Vishwani Agrawal, and Hassan Farhat
1988
What is the Path to Fast Fault Simulation?, Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad C. Seth, and John Waicukauski
1987
Decoding Substitution Ciphers by Means of Word Matching with Application to OCR, George Nagy, Sharad C. Seth, and Kent Einspahr
1985
Cutting chip-testing costs, Sharad C. Seth and Vishwani D. Agrawal
1984
An Analysis of the Use of Rademacher-Walsh Spectrum in Compact Testing, Ten-Chuan Hsiao and Sharad C. Seth
Characterizing the LSI Yield Equation from Wafer Test Data, Sharad C. Seth and Vishwani D. Agrawal
1983
Candide's Practical Principles of Experimental Pattern Recognition, George Nagy
A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems, Sharad C. Seth and Lester Lipsky
1982
Fault Coverage Requirement in Production Testing of LSI Circuits, Vishwani D. Agrawal, Sharad C. Seth, and Prathima Agrawal
1981
Forecasting Reject Rate of Tested LSI Chips, Sharad C. Seth and Vishwani D. Agrawal
A Graph Model for Pattern-Sensitive Faults in Random Access Memories, Sharad C. Seth and K. Narayanaswamy
1978
On Combinational Networks with Restricted Fan-Out, K. L. Kodandapani and Sharad C. Seth
1977
Diagnosis of Faults in Linear Tree Networks, Sharad C. Seth and K. L. Kodandapani