John A. Woollam
George Holmes Distinguished Professor
University of Nebraska-Lincoln
Electrical Engineering
jwoollam1@unl.edu

Research Interests: Optical, electrical, and microstructural studies of solids, films, interfacial effects and environmental effects on materials. Optical coatings, protective coatings, biomaterials and their interfaces; for example protein interactions on surfaces.

Dr. Woollam is the founder of the J.A. Woollam Company, a worldwide leader in spectroscopic ellipsometry. The company's website is at http://www.jawoollam.com/index.html

Follow

2007

PDF

Method of Calibrating Effects of Field of Classification Search Multi-AOI-System for Easy Changing Angles-of-Incidence In Ellipsometers and The Like, Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, and James D. Welch

PDF

Rotating or Rotatable Compensator Spectroscopic Ellipsometer System Including Multiple Element Lenses, Blaine D. Johs, Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam

PDF

Broadband Ellipsometer Or Polarimeter System Including at Least One Multiple Element Lens, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam

PDF

Combined Spatial Filter and Relay Systems in Rotating Compensator Ellipsometer/Polimeter, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam

PDF

Control of Beam Spot Size in Ellipsometer and The Like Systems, Martin M. Liphardt, Blaine D. Johs, John A. Woollam, and James D. Welch

PDF

Vacuum Ultraviolet Optical Analysis of Spin-Cast Chitosan Films Modified by Succinic Anhydride and Glycidyl Phenyl Ether, W. H. Nosal, D. W. Thompson, T. E. Tiwald, S. Sarkar, Anuradha Subramanian, and John A. Woollam

PDF

Spectroscopic Ellipsometer and Polarimeter Systems, John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt, and Galen L. Pfeiffer

PDF

Ellipsometer or Polarimeter and The Like System with Multiple Detector Element Detector in Environmental Control Chamber Including Secure Sample Access, John A. Woollam, Gregory K. Pribil, Martin M. Liphardt, and James Welch

PDF

Combined Use of Oscillating Means and Ellipsometry to Determine Uncorrelated Effective Thickness and Optical Constants of Material Deposited From a Fluid, John A. Woollam and James D. Welch

2005

PDF

UV-vis -infrared optical and AFM study of spin-cast chitosan films, W H. Nosal, D W. Thompson, Sabyasachi Sarkar, Anuradha Subramanian, J A. Woollam, and L Yan

PDF

Optical characterization of porous alumina from vacuum ultraviolet to mid-infrared, Daniel W. Thompson, Paul G. Snyder, Leon Castro, Li Yan, Prasuna Kaipa, and John A. Woollam

2004

PDF

Optical modeling of iridium thin film erosion under oxygen plasma exposure*, Li Yan and John A. Woollam

2003

PDF

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared, James N. Hilfiker, Corey L. Bungay, Ron A. Synowicki, Thomas E. Tiwald, Craig M. Herzinger, Blaine Johs, Greg K. Pribil, and John A. Woollam

2002

PDF

Optical constants and roughness study of dc magnetron sputtered iridium films, Li Yan and John A. Woollam

PDF

Oxygen plasma effects on optical properties of ZnSe films, Li Yan, John A. Woollam, and Eva Franke

2001

PDF

Giant photoresistivity and optically controlled switching in self-assembled nanowires, N. Kouklin, L. Menon, A. Z. Wong, Daniel W. Thompson, J. A. Woollam, P. F. Williams, and S. Bandyopadhyay

PDF

Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks, E. Sossna, A. Degen, I. W. Rangelow, M. Drzik, P. Hudek, T. E. Tiwald, and J. A. Woollam

PDF

Study of surface chemical changes and erosion rates for CV-1144-O silicone under electron cyclotron resonance oxygen plasma exposure, Li Yan, Xiang Gao, Corey Bungay, and John A. Woollam

PDF

Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs, S. Zangooie, Mathias Schubert, Daniel W. Thompson, and J. A. Woollam

PDF

Infrared optical properties of aged porous GaAs, S. Zangooie, Mathias Schubert, T. E. Tiwald, and J. A. Woollam

2000

PDF

Infrared switching electrochromic devices based on tungsten oxide, E. B. Franke, C. L. Trimble, J. S. Hale, Mathias Schubert, and J. A. Woollam

PDF

All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region, E. B. Franke, C. L. Trimble, Mathias Schubert, and J. A. Woollam

PDF

In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films, E. Franke, Mathias Schubert, J. A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl

PDF

Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry, Eva Franke, C. L. Trimble, M. J. DeVries, J. A. Woollam, Mathias Schubert, and F. Frost

PDF

Dielectric tensor for interfaces and individual layers in magnetic multilayer structures, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam

PDF

Thickness analysis of silicon membranes for stencil masks, E. Sossna, R. Kassing, I. W. Rangelow, C. M. Herzinger, T. E. Tiwald, J. A. Woollam, and Th. Wagner

PDF

Self-organization in porous 6H–SiC, S. Zangooie, J. A. Woollam, and H. Arwin

PDF

Optical properties of bulk and thin-film SrTiO3 on Si and Pt, Stefan Zollner, A. A. Demkov, R. Liu, P. L. Fejes, R.B. Gregory, Prasad Alluri, J. A. Curless, Z. Yu, J. Ramdani, R. Droopad, T. E. Tiwald, J. N. Hilfiker, and J. A. Woollam

1999

PDF

Optical constants of crystalline WO3 deposited by magnetron sputtering, Michael J. DeVries, Chris Trimble, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, and Jeffrey S. Hale

PDF

Dielectric tensor for magneto-optic NiMnSb, Xiang Gao, John A. Woollam, Roger D. Kirby, David Sellmyer, C. T. Tanaka, J. Nowak, and Jagadeesh S. Moodera

PDF

Variable angle of incidence analysis of magneto-optic multilayers, William A. McGahan, Liang-Yao Chen, and John A. Woollam

PDF

Near-band-gap CuPt-order-induced birefringence in Al0.48Ga0.52InP2, Mathias Schubert, Tino Hofmann, Bernd Rheinlander, Ines Pietzonka, Torsten Sass, Volker Gottschalch, and John A. Woollam

PDF

Isotropic dielectric functions of highly disordered AlxGa1-xInP (0≤x≤1) lattice matched to GaAs, Mathias Schubert, J. A. Woollam, G. Leibiger, B. Rheinlander, I. Pietzonka, T. Sab, and V. Gottschalch

PDF

Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, Stefan Zollner, Jim Christiansen, R. B. Gregory, T. Wetteroth, S. R. Wilson, and Adrian R. Powell

1998

PDF

In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures, E. Franke, Mathias Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, Daniel W. Thompson, H. Yao, and J. A. Woollam

PDF

Thickness dependence of interfacial magneto-optic effects, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam

PDF

Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry, Xiang Gao, Jeff Hale, Scott Heckens, and John A. Woollam

PDF

System and Method for Improving Data Acquisition Capability in Spectroscopic Ellipsometers, Steven E. Green, Craig M. Herzinger, Blaine D. Johs, and John A. Woollam

PDF

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation, C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson

PDF

Magnetic and Magneto-optic Study of a Layered Co/Pt - Dysprosium-Iron-Garnet System, J.M. Meldrim, Roger D. Kirby, M.J. DeVries, John A. Woollam, and David J. Sellmyer

PDF

Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry, Thomas E. Tiwald, Daniel W. Thompson, and John A. Woollam

1997

PDF

Infrared ellipsometry on hexagonal and cubic boron nitride thin films, E. Franke, H. Neumann, Mathias Schubert, T. E. Tiwald, J. A. Woollam, and J. Hahn

PDF

Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range, Eva Franke, Mathias Schubert, Horst Neumann, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, Jens Hahn, and Frank Richter

PDF

Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers, Xiang Gao, Darin W. Glenn, Scott Heckens, Daniel W. Thompson, and John A. Woollam

PDF

In-situ ellipsometric control of magnetic multilayer deposition (abstract), Xiang Gao, Scott Heckens, and John A. woollam

PDF

Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures, Xiang Gao, Daniel W. Thompson, and John A. Woollam

PDF

Multiple Order Dispersive Optics System and Method of Use, Blaine D. Johs, Ping He, Steven E. Green, Shakil A. Pittal, and John A. Woollam

PDF

Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example, Mathias Schubert, B. Rheinlander, E. Franke, H. Neumann, T. E. Tiwald, and J. A. Woollam

PDF

Optical and magneto-optical properties of MnPt3 films (abstract), Kurt W. Wierman, J. N. Hilfiker, Renat F. Sabiryanov, Sitaram Jaswal, Roger D. Kirby, and John A. Woollam

PDF

Optical and magneto-optical constants of MnPt3, K. W. Wierman, J. N. Hilfiker, R. F. Sabiryanov, Sitaram S. Jaswal, Roger D. Kirby, and John A. Woollam

1996

PDF

Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, F. G. Celii, Y.-C. Kao, D. Chow, B. Johs, and J. A. Woollam

PDF

In situ and ex situ optical characterization of electro deposited magneto-optic materials, James N. Hilfiker, Darin W. Glenn, Scott W. Heckens, John A. Woollam, and Kurt W. Weirman

PDF

United States Patent: SYSTEM AND METHOD FOR COMPENSATING POLARIZATION-DEPENDENT SENSITIVITY OF DISPERSIVE OPTICS IN A ROTATING ANALYZER ELLIPSOMETER SYSTEM, Blaine D. Johs, Shakil A. Pittal, Steven E. Green, John A. Woollam, David W. Doerr, and Reed A. Christenson

PDF

Growth of diamond by rf plasma-assisted chemical vapor deposition, Duane E. Meyer, Natale J. Ianno, John A. Woollam, A. B. Swartzlander, and A. J. Nelson

PDF

Oxygen plasma asher contamination: An analysis of sources and remedies, R. A. Synowicki, Jeffrey S. Hale, William A. McGahan, Natale J. Ianno, and John A. Woollam

1995

PDF

InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, B. Johs, and J. A. Woollam

PDF

Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis, C. M. Herzinger, H. Yao, Paul G. Snyder, F. G. Celii, Y. C. Kao, B. Johs, and J. A. Woollam

PDF

Optical constants of GaxIn1-xP lattice matched to GaAs, Mathias Schubert, V. Gottschalch, Craig M. Herzinger, Huade Yao, Paul G. Snyder, and John A. Woollam

PDF

Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs, Paul G. Snyder, Natale J. Ianno, B. Wigert, S. Pittal, B. Johs, and John A. Woollam

1994

PDF

Sputtering pressure effects and temperature-dependent magnetism of Co/Pd multilayers, S.Y. Jeong, Z.S. Shan, P. He, J.X. Shen, Y.B. Zhang, John A. Woollam, and David J. Sellmyer

PDF

Magneto-optical and structural properties of BiAlDylG/Fe multilayers, J. X. Shen, Kurt W. Wierman, Y. B. Zhang, Roger D. Kirby, John A. Woollam, and David J. Sellmyer

PDF

United States Patent: Ellipsometer, John A. Woollam, Blaine D. Johs, David W. Doerr, and Reed A. Christenson

PDF

Magnetic and magneto-optic properties of sputtered Co/Ni multilayers, Y. B. Zhang, P. He, John A. Woollam, J. X. Shen, Roger D. Kirby, and David J. Sellmyer

PDF

ANISOTROPY AND MAGNETO-OPTICAL PROPERTIES OF SPUTTERED Co/Ni MULTILAYER THIN FILMS, Y.B. Zhang, John A. Woollam, Z.S. Shan, J.X. Shen, and David J. Sellmyer

1993

PDF

Nanostructural effects and interface magnetism in Co/Pd multilayers, Ping He, Z.-S. Shan, John A. Woollam, and David J. Sellmyer

PDF

Behavior of disordered Co-Pd, Co-Ag, and Co-Mo alloys in multilayer interfaces, Z.S. Shan, Ping He, C. Moore, John A. Woollam, and David J. Sellmyer

PDF

Interface magnetism and superparamagnetism of Co/Cu multilayers, Z.S. Shan, S. Nafis, John Woollam, Sy_Hwang Liou, and David J. Sellmyer

PDF

Photoellipsometry determination of surface Fermi level in GaAs (100), Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam

PDF

Spectroscopic ellipsometry studies of HF treated Si (100) surfaces, Huade Yao, John A. Woollam, and Samual A. Alterovitz

1992

PDF

Graded refractive index silicon oxynitride thin film characterized by spectroscopic ellipsometry, Paul G. Snyder, Yi-Ming Xiong, and John A. Woollam

PDF

Silicon nitride/silicon oxynitrid/silicon dioxide thin film multilayer characterized by variable angle spectroscopic ellipsometry, Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam

1991

PDF

Study of InGaAs-Based Modulation Doped Field Effect Transistor Structures Using Variable-Angle Spectroscopic Ellipsometry, S. A. Alterovitz, R. M. Sieg, H. D. Yao, Paul G. Snyder, John A. Woollam, J. Pamulapati, P. K. Bhattacharya, and P. A. P. A. Sekula-Moise

PDF

Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films, Liang-Yao Chen, Ping He, S. Nafis, William A. McGahan, John A. Woollam, and David J. Sellmyer

PDF

Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers, Ping He, William A. McGahan, S. Nafis, John A. Woollam, Z.S. Shan, Sy_Hwang Liou, F. Sequeda, T. McDaniel, and H. Do

PDF

Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures, Ping He, William A. McGahan, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do

PDF

Magneto-optic properties of uranium-based compounds, Roger D. Kirby, J. X. Shen, John A. Woollam, and David J. Sellmyer

PDF

The process-controlled magnetic properties of nanostructured Co/Ag composite films, Sy_Hwang Liou, S. Malhotra, Z.S. Shan, David J. Sellmyer, S. Nafis, John A. Woollam, C.P. Reed, R.J. DeAngelis, and G.M. Chow

PDF

Optical and magneto-optical characterization of TbFeCo thin films in trilayer structures, William A. McGahan, Ping He, Liang-Yao Chen, Sal Bonafede, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do

PDF

Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers, S. Nafis, John A. Woollam, Z.S. Shan, and David J. Sellmyer

PDF

Temperature dependence of optical properties of GaAs, Huade Yao, Paul G. Snyder, and John A. Woollam

1990

PDF

Enhancement of magneto-optical Kerr effects, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam

PDF

Kerr effect of two-medium layered systems, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam

PDF

Ellipsometric analysis of computer disk structures, Ping He, Bhola N. De, Laing-Yao Chen, Yong Zhao, John A. Woollam, Mark Miller, and Edward Simpson

PDF

Modeling AIxGa1-xAs optical constants as functions of composition, Paul G. Snyder, John A. Woollam, Samuel A. Alterovitz, and Blaine D. Johs

1989

PDF

Generalized model for the optical absorption edge in a-Si:H, T. Datta and John A. Woollam

PDF

Optical-absorption edge and disorder effects in hydrogenated amorphous diamondlike carbon films, T. Datta, John A. Woollam, and W. Notohamiprodjo

PDF

Ellipsometric study of Al2O3/Ag/Si and SiO2/Ag/quartz ashed in an oxygen plasma, Bhola N. De and John A. Woollam

PDF

Preparation of high TcTl-Ba-Ca-Cu-O thin films by pulsed laser evaporation and Tl2O3 vapor processing, B. Johs, D. Thompson, N.J. Ianno, John A. Woollam, Sy_Hwang Liou, A.M. Hermann, Z.Z. Sheng, W. Kiehl, O. Shams, X. Fei, L. Sheng, and Y.H. Liu

PDF

Highly oriented Tl2Ba2Ca2Cu3O10 thin films by pulsed laser evaporation, Sy_Hwang Liou, K.D. Aylesworth, N.J. Ianno, B. Johs, D. Thompson, D. Meyer, John A. Woollam, and Colleen Berry

PDF

Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures, William A. McGahan, Liang-Yao Chen, Z. S. Shan, David J. Sellmyer, and John A. Woollam

PDF

Radio-frequency plasma chemical vapor deposition growth of diamond, Duane E. Meyer, Rodney O. Dillon, and John A. Woollam

1988

PDF

Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatings, Kazem Memarzadeh, John A. Woollam, and Abe Belkind

PDF

Thin-film hermeticity: A quantitative analysis of diamond-like carbon using variable angle spectroscopic ellipsometry, S. Orzeszko, Bhola N. De, John A. Woollam, John J. Pouch, Samuel A. Alterovitz, and David C. Ingram

PDF

Variable angle spectroscopic magneto-optics and ellipsometry: Application to DyCo multilayers , Thomas E. Tiwald, William A. McGahan, Z. S. Shan, Alan M. Massengale, and John A. Woollam

PDF

Ellipsometric and magneto-optic properties of sputtered dysprosium-iron multilayers, Thomas E. Tiwald, John A. Woollam, and David J. Sellmyer

1986

PDF

Thermal and structural stability of cosputtered amorphous TaxCu1-x alloy thin films on GaAs, J.E. Oh, John A. Woollam, K.D. Aylesworth, David J. Sellmyer, and J.J. Pouch

1983

PDF

Interfacial Electrical Properties of Ion-Beam Sputter Deposited Amorphous Carbon on Silicon, A. Azim Khan, John A. Woollam, Y. Chung, and B. Banks