Department of Electrical Engineering
University of Nebraska-Lincoln
Lincoln, Nebraska 68588 United States
jwoollam1@unl.edu
Research Interests:
Optical, electrical, and microstructural studies of solids, films, interfacial effects and environmental effects on materials. Optical coatings, protective coatings, biomaterials and their interfaces; for example protein interactions on surfaces.
Dr. Woollam is the founder of the J.A. Woollam Company, a worldwide leader in spectroscopic ellipsometry. The company's website is at http://www.jawoollam.com/index.html
2007
Method of Calibrating Effects of Field of Classification Search Multi-AOI-System for Easy Changing Angles-of-Incidence In Ellipsometers and The Like, Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, and James D. Welch
Rotating or Rotatable Compensator Spectroscopic Ellipsometer System Including Multiple Element Lenses, Blaine D. Johs, Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam
Broadband Ellipsometer Or Polarimeter System Including at Least One Multiple Element Lens, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam
Combined Spatial Filter and Relay Systems in Rotating Compensator Ellipsometer/Polimeter, Martin M. Liphardt, Blaine D. Johs, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He, and John A. Woollam
Control of Beam Spot Size in Ellipsometer and The Like Systems, Martin M. Liphardt, Blaine D. Johs, John A. Woollam, and James D. Welch
Vacuum Ultraviolet Optical Analysis of Spin-Cast Chitosan Films Modified by Succinic Anhydride and Glycidyl Phenyl Ether, W. H. Nosal, D. W. Thompson, T. E. Tiwald, S. Sarkar, Anuradha Subramanian, and John A. Woollam
Spectroscopic Ellipsometer and Polarimeter Systems, John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt, and Galen L. Pfeiffer
Ellipsometer or Polarimeter and The Like System with Multiple Detector Element Detector in Environmental Control Chamber Including Secure Sample Access, John A. Woollam, Gregory K. Pribil, Martin M. Liphardt, and James Welch
Combined Use of Oscillating Means and Ellipsometry to Determine Uncorrelated Effective Thickness and Optical Constants of Material Deposited From a Fluid, John A. Woollam and James D. Welch
2005
UV-vis -infrared optical and AFM study of spin-cast chitosan films, W H. Nosal, D. W. Thompson, Sabyasachi Sarkar, Anuradha Subramanian, John A. Woollam, and L Yan
Optical characterization of porous alumina from vacuum ultraviolet to mid-infrared, Daniel W. Thompson, Paul G. Snyder, Leon Castro, Li Yan, Prasuna Kaipa, and John A. Woollam
2004
Optical modeling of iridium thin film erosion under oxygen plasma exposure*, Li Yan and John A. Woollam
2003
Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared, James N. Hilfiker, Corey L. Bungay, Ron A. Synowicki, Thomas E. Tiwald, Craig M. Herzinger, Blaine Johs, Greg K. Pribil, and John A. Woollam
2002
Optical constants and roughness study of dc magnetron sputtered iridium films, Li Yan and John A. Woollam
Oxygen plasma effects on optical properties of ZnSe films, Li Yan, John A. Woollam, and Eva Franke
2001
Giant photoresistivity and optically controlled switching in self-assembled nanowires, N. Kouklin, L. Menon, A. Z. Wong, Daniel W. Thompson, John A. Woollam, P. F. Williams, and Supriyo Bandyopadhyay
Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks, E. Sossna, A. Degen, I. W. Rangelow, M. Drzik, P. Hudek, T. E. Tiwald, and John A. Woollam
Study of surface chemical changes and erosion rates for CV-1144-O silicone under electron cyclotron resonance oxygen plasma exposure, Li Yan, Xiang Gao, Corey Bungay, and John A. Woollam
Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs, S. Zangooie, Mathias Schubert, Daniel W. Thompson, and John A. Woollam
Infrared optical properties of aged porous GaAs, S. Zangooie, Mathias Schubert, T. E. Tiwald, and John A. Woollam
2000
Infrared switching electrochromic devices based on tungsten oxide, E. B. Franke, C. L. Trimble, J. S. Hale, Mathias Schubert, and John A. Woollam
All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region, E. B. Franke, C. L. Trimble, Mathias Schubert, and John A. Woollam
In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films, E. Franke, Mathias Schubert, John A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl
Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry, Eva Franke, C. L. Trimble, M. J. DeVries, John A. Woollam, Mathias Schubert, and F. Frost
Dielectric tensor for interfaces and individual layers in magnetic multilayer structures, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam
Thickness analysis of silicon membranes for stencil masks, E. Sossna, R. Kassing, I. W. Rangelow, C. M. Herzinger, T. E. Tiwald, John A. Woollam, and Th. Wagner
Self-organization in porous 6H–SiC, S. Zangooie, John A. Woollam, and H. Arwin
Optical properties of bulk and thin-film SrTiO3 on Si and Pt, Stefan Zollner, A. A. Demkov, R. Liu, P. L. Fejes, R.B. Gregory, Prasad Alluri, J. A. Curless, Z. Yu, J. Ramdani, R. Droopad, T. E. Tiwald, J. N. Hilfiker, and John A. Woollam
1999
Optical constants of crystalline WO3 deposited by magnetron sputtering, Michael J. DeVries, Chris Trimble, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, and Jeffrey S. Hale
Dielectric tensor for magneto-optic NiMnSb, Xiang Gao, John A. Woollam, Roger D. Kirby, David J. Sellmyer, C. T. Tanaka, J. Nowak, and Jagadeesh S. Moodera
Variable angle of incidence analysis of magneto-optic multilayers, William A. McGahan, Liang-Yao Chen, and John A. Woollam
Near-band-gap CuPt-order-induced birefringence in Al0.48Ga0.52InP2, Mathias Schubert, Tino Hofmann, Bernd Rheinlander, Ines Pietzonka, Torsten Sass, Volker Gottschalch, and John A. Woollam
Isotropic dielectric functions of highly disordered AlxGa1-xInP (0≤x≤1) lattice matched to GaAs, Mathias Schubert, John A. Woollam, G. Leibiger, B. Rheinlander, I. Pietzonka, T. Sab, and V. Gottschalch
Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, Stefan Zollner, Jim Christiansen, R. B. Gregory, T. Wetteroth, S. R. Wilson, and Adrian R. Powell
1998
In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures, E. Franke, Mathias Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, Daniel W. Thompson, H. Yao, and John A. Woollam
Thickness dependence of interfacial magneto-optic effects, Xiang Gao, Michael J. DeVries, Daniel W. Thompson, and John A. Woollam
Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry, Xiang Gao, Jeff Hale, Scott Heckens, and John A. Woollam
System and Method for Improving Data Acquisition Capability in Spectroscopic Ellipsometers, Steven E. Green, Craig M. Herzinger, Blaine D. Johs, and John A. Woollam
Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation, C. M. Herzinger, B. Johs, W. A. McGahan, John A. Woollam, and W. Paulson
Magnetic and Magneto-optic Study of a Layered Co/Pt - Dysprosium-Iron-Garnet System, J.M. Meldrim, Roger D. Kirby, M.J. DeVries, John A. Woollam, and David J. Sellmyer
Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry, Thomas E. Tiwald, John A. Woollam, and John A. Woollam
1997
Infrared ellipsometry on hexagonal and cubic boron nitride thin films, E. Franke, H. Neumann, Mathias Schubert, T. E. Tiwald, John A. Woollam, and J. Hahn
Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range, Eva Franke, Mathias Schubert, Horst Neumann, Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, Jens Hahn, and Frank Richter
Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers, Xiang Gao, Darin W. Glenn, Scott Heckens, Daniel W. Thompson, and John A. Woollam
In-situ ellipsometric control of magnetic multilayer deposition (abstract), Xiang Gao, Scott Heckens, and John A. Woollam
Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures, Xiang Gao, Daniel W. Thompson, and John A. Woollam
Multiple Order Dispersive Optics System and Method of Use, Blaine D. Johs, Ping He, Steven E. Green, Shakil A. Pittal, and John A. Woollam
Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example, Mathias Schubert, B. Rheinlander, E. Franke, H. Neumann, T. E. Tiwald, and John A. Woollam
Optical and magneto-optical properties of MnPt3 films (abstract), Kurt W. Wierman, J. N. Hilfiker, Renat F. Sabiryanov, Sitaram Jaswal, Roger D. Kirby, and John A. Woollam
Optical and magneto-optical constants of MnPt3, K. W. Wierman, J. N. Hilfiker, R. F. Sabiryanov, Sitaram S. Jaswal, Roger D. Kirby, and John A. Woollam
1996
Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, F. G. Celii, Y.-C. Kao, D. Chow, B. Johs, and John A. Woollam
In situ and ex situ optical characterization of electro deposited magneto-optic materials, James N. Hilfiker, Darin W. Glenn, Scott W. Heckens, John A. Woollam, and Kurt W. Weirman
United States Patent: SYSTEM AND METHOD FOR COMPENSATING POLARIZATION-DEPENDENT SENSITIVITY OF DISPERSIVE OPTICS IN A ROTATING ANALYZER ELLIPSOMETER SYSTEM, Blaine D. Johs, Shakil A. Pittal, Steven E. Green, John A. Woollam, David W. Doerr, and Reed A. Christenson
Growth of diamond by rf plasma-assisted chemical vapor deposition, Duane E. Meyer, Natale J. Ianno, John A. Woollam, A. B. Swartzlander, and A. J. Nelson
Oxygen plasma asher contamination: An analysis of sources and remedies, R. A. Synowicki, Jeffrey S. Hale, William A. McGahan, Natale J. Ianno, and John A. Woollam
1995
InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry, C. M. Herzinger, Paul G. Snyder, B. Johs, and John A. Woollam
Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis, C. M. Herzinger, H. Yao, Paul G. Snyder, F. G. Celii, Y. C. Kao, B. Johs, and John A. Woollam
Optical constants of GaxIn1-xP lattice matched to GaAs, Mathias Schubert, V. Gottschalch, Craig M. Herzinger, Huade Yao, Paul G. Snyder, and John A. Woollam
Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs, Paul G. Snyder, Natale J. Ianno, B. Wigert, S. Pittal, B. Johs, and John A. Woollam
1994
Sputtering pressure effects and temperature-dependent magnetism of Co/Pd multilayers, S.Y. Jeong, Z.S. Shan, P. He, J.X. Shen, Y.B. Zhang, John A. Woollam, and David J. Sellmyer
Magneto-optical and structural properties of BiAlDylG/Fe multilayers, J. X. Shen, Kurt W. Wierman, Y. B. Zhang, Roger D. Kirby, John A. Woollam, and David J. Sellmyer
United States Patent: Ellipsometer, John A. Woollam, Blaine D. Johs, David W. Doerr, and Reed A. Christenson
Magnetic and magneto-optic properties of sputtered Co/Ni multilayers, Y. B. Zhang, P. He, John A. Woollam, J. X. Shen, Roger D. Kirby, and David J. Sellmyer
ANISOTROPY AND MAGNETO-OPTICAL PROPERTIES OF SPUTTERED Co/Ni MULTILAYER THIN FILMS, Y.B. Zhang, John A. Woollam, Z.S. Shan, J.X. Shen, and David J. Sellmyer
1993
Nanostructural effects and interface magnetism in Co/Pd multilayers, Ping He, Z.-S. Shan, John A. Woollam, and David J. Sellmyer
Behavior of disordered Co-Pd, Co-Ag, and Co-Mo alloys in multilayer interfaces, Z.S. Shan, Ping He, C. Moore, John A. Woollam, and David J. Sellmyer
Interface magnetism and superparamagnetism of Co/Cu multilayers, Z.S. Shan, S. Nafis, John A. Woollam, Sy_Hwang Liou, and David J. Sellmyer
Photoellipsometry determination of surface Fermi level in GaAs (100), Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam
Spectroscopic ellipsometry studies of HF treated Si (100) surfaces, Huade Yao, John A. Woollam, and Samual A. Alterovitz
1992
Graded refractive index silicon oxynitride thin film characterized by spectroscopic ellipsometry, Paul G. Snyder, Yi-Ming Xiong, and John A. Woollam
Silicon nitride/silicon oxynitrid/silicon dioxide thin film multilayer characterized by variable angle spectroscopic ellipsometry, Yi-Ming Xiong, Paul G. Snyder, and John A. Woollam
1991
Study of InGaAs-Based Modulation Doped Field Effect Transistor Structures Using Variable-Angle Spectroscopic Ellipsometry, S. A. Alterovitz, R. M. Sieg, H. D. Yao, Paul G. Snyder, John A. Woollam, J. Pamulapati, P. K. Bhattacharya, and P. A. P. A. Sekula-Moise
Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films, Liang-Yao Chen, Ping He, S. Nafis, William A. McGahan, John A. Woollam, and David J. Sellmyer
Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers, Ping He, William A. McGahan, S. Nafis, John A. Woollam, Z.S. Shan, Sy_Hwang Liou, F. Sequeda, T. McDaniel, and H. Do
Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures, Ping He, William A. McGahan, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do
Magneto-optic properties of uranium-based compounds, Roger D. Kirby, J. X. Shen, John A. Woollam, and David J. Sellmyer
The process-controlled magnetic properties of nanostructured Co/Ag composite films, Sy_Hwang Liou, S. Malhotra, Z.S. Shan, David J. Sellmyer, S. Nafis, John A. Woollam, C.P. Reed, R.J. DeAngelis, and G.M. Chow
Optical and magneto-optical characterization of TbFeCo thin films in trilayer structures, William A. McGahan, Ping He, Liang-Yao Chen, Sal Bonafede, John A. Woollam, F. Sequeda, T. McDaniel, and H. Do
Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers, S. Nafis, John A. Woollam, Z.S. Shan, and David J. Sellmyer
Temperature dependence of optical properties of GaAs, Huade Yao, Paul G. Snyder, and John A. Woollam
1990
Enhancement of magneto-optical Kerr effects, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam
Kerr effect of two-medium layered systems, Liang-Yao Chen, William A. McGahan, Z.S. Shan, David J. Sellmyer, and John A. Woollam
Ellipsometric analysis of computer disk structures, Ping He, Bhola N. De, Laing-Yao Chen, Yong Zhao, John A. Woollam, Mark Miller, and Edward Simpson
Modeling AIxGa1-xAs optical constants as functions of composition, Paul G. Snyder, John A. Woollam, Samuel A. Alterovitz, and Blaine D. Johs
1989
Generalized model for the optical absorption edge in a-Si:H, T. Datta and John A. Woollam
Optical-absorption edge and disorder effects in hydrogenated amorphous diamondlike carbon films, T. Datta, John A. Woollam, and W. Notohamiprodjo
Ellipsometric study of Al2O3/Ag/Si and SiO2/Ag/quartz ashed in an oxygen plasma, Bhola N. De and John A. Woollam
Preparation of high TcTl-Ba-Ca-Cu-O thin films by pulsed laser evaporation and Tl2O3 vapor processing, B. Johs, D. Thompson, N.J. Ianno, John A. Woollam, Sy_Hwang Liou, A.M. Hermann, Z.Z. Sheng, W. Kiehl, O. Shams, X. Fei, L. Sheng, and Y.H. Liu
Highly oriented Tl2Ba2Ca2Cu3O10 thin films by pulsed laser evaporation, Sy_Hwang Liou, K.D. Aylesworth, N.J. Ianno, B. Johs, D. Thompson, D. Meyer, John A. Woollam, and Colleen Berry
Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures, William A. McGahan, Liang-Yao Chen, Z. S. Shan, David J. Sellmyer, and John A. Woollam
Radio-frequency plasma chemical vapor deposition growth of diamond, Duane E. Meyer, Rodney O. Dillon, and John A. Woollam
1988
Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatings, Kazem Memarzadeh, John A. Woollam, and Abe Belkind
Thin-film hermeticity: A quantitative analysis of diamond-like carbon using variable angle spectroscopic ellipsometry, S. Orzeszko, Bhola N. De, John A. Woollam, John J. Pouch, Samuel A. Alterovitz, and David C. Ingram
Variable angle spectroscopic magneto-optics and ellipsometry: Application to DyCo multilayers, Thomas E. Tiwald, William A. McGahan, Z. S. Shan, Alan M. Massengale, and John A. Woollam
Ellipsometric and magneto-optic properties of sputtered dysprosium-iron multilayers, Thomas E. Tiwald, John A. Woollam, and David J. Sellmyer
1986
Thermal and structural stability of cosputtered amorphous TaxCu1-x alloy thin films on GaAs, J.E. Oh, John A. Woollam, K.D. Aylesworth, David J. Sellmyer, and J.J. Pouch
1983
Interfacial Electrical Properties of Ion-Beam Sputter Deposited Amorphous Carbon on Silicon, A. Azim Khan, John A. Woollam, Y. Chung, and B. Banks